Abstract
Three-dimensional atom probe analyses of the interfaces between CoFe and Cu layers has shown that both roughness and chemical intermixing can occur independently. Interfaces formed by the deposition of Cu onto CoFe mimic the roughness present in previously deposited interfaces, but have a very small amount of interfacial mixing. In contrast, interfaces formed by the deposition of CoFe onto Cu are less rough, but more chemically intermixed. The region of chemical intermixing formed when CoFe is deposited onto Cu (0.7-1.0 nm) is approximately two times larger than that when Cu is deposited onto CoFe (0.3-0.5 nm).
Original language | English (US) |
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Pages (from-to) | 7517-7521 |
Number of pages | 5 |
Journal | Journal of Applied Physics |
Volume | 89 |
Issue number | 11 II |
DOIs | |
State | Published - Jun 1 2001 |
Event | 8th Joint Magnetism and Magnetic Materials-Intermag Conference - San Antonio, TX, United States Duration: Jan 7 2001 → Jan 11 2001 |
ASJC Scopus subject areas
- General Physics and Astronomy