@inproceedings{423cc7d8f5114c4091df17543a552cf3,
title = "Atom-probe microanalysis of metallic nanostructured materials",
abstract = "Atom-probe techniques have been used to characterize nanostructured metallic materials prepared by thermal evaporation and by sputtering. Multilayer samples of Fe-Cr have been prepared by sputter deposition and analyzed using the Oxford position-sensitive atom probe. This has made it possible to observe the quality of interfaces in the material, and also accurately determine local compositions at each layer within the multilayer stack. Preliminary experiments aimed at producing dual phase nanocrystalline films by thermal evaporator deposition are also reported.",
author = "MacKenzie, {Ross A D} and Alfred Cerezo and Conyers, {James S.} and Petford-Long, {Amanda K.} and Sijbrandij, {Sybren J.} and Smith, {George D W}",
year = "1993",
language = "English (US)",
isbn = "1558991816",
series = "Materials Research Society Symposium Proceedings",
publisher = "Publ by Materials Research Society",
pages = "167--172",
booktitle = "Materials Research Society Symposium Proceedings",
note = "Proceedings of the 3rd Biennial Meeting of Chemical Perspectives of Microelectronic Materials ; Conference date: 30-11-1992 Through 03-12-1992",
}