Atom-Probe Tomographic Study of Interfacial Intermixing and Segregation in InAs/GaSb Superlattices

Y. Meng, H. Kim, D. Isheim, D. N. Seidman, J. -M Zuo

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	958-959
Journal	Microscopy and Microanalysis
Volume	19
State	Published - 2013

Cite this

@article{c8d199be60b8448d81c9bfcaf157aa7b,

title = "Atom-Probe Tomographic Study of Interfacial Intermixing and Segregation in InAs/GaSb Superlattices",

author = "Y. Meng and H. Kim and D. Isheim and Seidman, {D. N.} and Zuo, {J. -M}",

year = "2013",

language = "English",

volume = "19",

pages = "958--959",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Cambridge University Press",

}