Atom Probe Tomography Analysis of Ag Doping in 2D Layered Material (PbSe)5(Bi2Se3)3

Xiaochen Ren; Arunima K. Singh; Lei Fang; Mercouri G. Kanatzidis; Francesca Tavazza; Albert V. Davydov; Lincoln J. Lauhon

doi:10.1021/acs.nanolett.6b02104

Atom Probe Tomography Analysis of Ag Doping in 2D Layered Material (PbSe)₅(Bi₂Se₃)₃

Xiaochen Ren, Arunima K. Singh, Lei Fang, Mercouri G. Kanatzidis, Francesca Tavazza, Albert V. Davydov, Lincoln J. Lauhon^*

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

9 Scopus citations

Abstract

Impurity doping in two-dimensional (2D) materials can provide a route to tuning electronic properties, so it is important to be able to determine the distribution of dopant atoms within and between layers. Here we report the tomographic mapping of dopants in layered 2D materials with atomic sensitivity and subnanometer spatial resolution using atom probe tomography (APT). APT analysis shows that Ag dopes both Bi₂Se₃ and PbSe layers in (PbSe)₅(Bi₂Se₃)₃, and correlations in the position of Ag atoms suggest a pairing across neighboring Bi₂Se₃ and PbSe layers. Density functional theory (DFT) calculations confirm the favorability of substitutional doping for both Pb and Bi and provide insights into the observed spatial correlations in dopant locations.

Original language	English (US)
Pages (from-to)	6064-6069
Number of pages	6
Journal	Nano letters
Volume	16
Issue number	10
DOIs	https://doi.org/10.1021/acs.nanolett.6b02104
State	Published - Oct 12 2016

Funding

This work was performed under the following financial assistance award 70NANB14H012 from U.S. Department of Commerce, National Institute of Standards and Technology as part of the Center for Hierarchical Materials Design (CHiMaD). F.T. and A.V.D. are funded by the Materials Genome Initiative funding allocated to National Institute of Standards and Technology (NIST). A.K.S. is funded by the Professional Research Experience Postdoctoral Fellowship under Award No. 70NANB11H012. Atom probe tomography was performed at the Northwestern University Center for Atom-Probe Tomography (NUCAPT), which is a Shared Facility at the Materials Research Center of Northwestern University, supported by the National Science Foundation's MRSEC program (DMR-1121262). Work at Argonne National Laboratory was supported by the U.S. Department of Energy, Office of Science, Materials Sciences and Engineering Division. Computational resources were provided by the Texas Advanced Computing Center under Contract No. TG-DMR150006. This work used the Extreme Science and Engineering Discovery Environment (XSEDE), which is supported by the National Science Foundation Grant No. ACI-1053575.

Keywords

2D materials
Atom probe tomography
DFT
Doping
Materials genome initiative

ASJC Scopus subject areas

Condensed Matter Physics
Mechanical Engineering
Bioengineering
General Chemistry
General Materials Science

Access to Document

10.1021/acs.nanolett.6b02104

Cite this

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title = "Atom Probe Tomography Analysis of Ag Doping in 2D Layered Material (PbSe)5(Bi2Se3)3",

abstract = "Impurity doping in two-dimensional (2D) materials can provide a route to tuning electronic properties, so it is important to be able to determine the distribution of dopant atoms within and between layers. Here we report the tomographic mapping of dopants in layered 2D materials with atomic sensitivity and subnanometer spatial resolution using atom probe tomography (APT). APT analysis shows that Ag dopes both Bi2Se3 and PbSe layers in (PbSe)5(Bi2Se3)3, and correlations in the position of Ag atoms suggest a pairing across neighboring Bi2Se3 and PbSe layers. Density functional theory (DFT) calculations confirm the favorability of substitutional doping for both Pb and Bi and provide insights into the observed spatial correlations in dopant locations.",

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AU - Kanatzidis, Mercouri G.

AU - Tavazza, Francesca

AU - Davydov, Albert V.

AU - Lauhon, Lincoln J.

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AB - Impurity doping in two-dimensional (2D) materials can provide a route to tuning electronic properties, so it is important to be able to determine the distribution of dopant atoms within and between layers. Here we report the tomographic mapping of dopants in layered 2D materials with atomic sensitivity and subnanometer spatial resolution using atom probe tomography (APT). APT analysis shows that Ag dopes both Bi2Se3 and PbSe layers in (PbSe)5(Bi2Se3)3, and correlations in the position of Ag atoms suggest a pairing across neighboring Bi2Se3 and PbSe layers. Density functional theory (DFT) calculations confirm the favorability of substitutional doping for both Pb and Bi and provide insights into the observed spatial correlations in dopant locations.

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