Atom-probe tomography: Detection efficiency and resolution of nanometer-scale precipitates in a Ti-5553 alloy

D. Isheim*, J. Coakley, A. Radecka, D. Dye, T. J. Prosa, Y. Chen, P. A.J. Bagot, D. N. Seidman

*Corresponding author for this work

Research output: Contribution to journalShort surveypeer-review

Original languageEnglish (US)
Pages (from-to)702-703
Number of pages2
JournalMicroscopy and Microanalysis
Volume22
DOIs
StatePublished - 2016

ASJC Scopus subject areas

  • Instrumentation

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