Atom probe tomography studies of rf materials

J. Norem*, P. Bauer, J. Sebastian, D. N. Seidman

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Scopus citations

Abstract

We are constructing a facility that combines an atom probe field ion microscope with a multi-element in-situ deposition and surface modification capability. This system is dedicated to rf studies and the initial goal will be to understand the properties of evaporative coatings: field emission, bonding, interdiffusion, etc., to suppress breakdown and dark currents in normal cavities. We also hope to use this system to look more generally at interactions of surface structure and high rf fields. We will present preliminary data on structures relevant to normal and superconducting rf systems.

Original languageEnglish (US)
Title of host publicationProceedings of the Particle Accelerator Conference, PAC 2005
Pages612-614
Number of pages3
DOIs
StatePublished - Dec 1 2005
EventParticle Accelerator Conference, PAC 2005 - Knoxville, TN, United States
Duration: May 16 2005May 20 2005

Publication series

NameProceedings of the IEEE Particle Accelerator Conference
Volume2005

Other

OtherParticle Accelerator Conference, PAC 2005
CountryUnited States
CityKnoxville, TN
Period5/16/055/20/05

ASJC Scopus subject areas

  • Engineering(all)

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