Atomic decay rates in a dielectric medium: A test of the standard QED Hamiltonian

S. T. Ho; Prem Kumar

Atomic decay rates in a dielectric medium: A test of the standard QED Hamiltonian

S. T. Ho^*, Prem Kumar

^*Corresponding author for this work

Electrical and Computer Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

Because of the possibility of manipulating the spontaneous decay rate of active atoms embedded in a dielectric medium, there has recently, been great interest in studying the behavior of these atoms. The decay rate of the atoms warrants special study as it is affected by additional physical factors not present in cavity QED. It is shown that the usual value given for one of these additional factors is incorrect, and the correct value can be related to a basic property of the standard QED Hamiltonian.

Original language	English (US)
Title of host publication	XVII International Conference on Quantum Electronics. Digest of
Publisher	Publ by IEEE
Number of pages	1
State	Published - Dec 1 1990
Event	17th International Conference on Quantum Electronics - IQEC '90 - Anaheim, CA, USA Duration: May 21 1990 → May 25 1990

Other

Other	17th International Conference on Quantum Electronics - IQEC '90
City	Anaheim, CA, USA
Period	5/21/90 → 5/25/90

ASJC Scopus subject areas

General Engineering

Cite this

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title = "Atomic decay rates in a dielectric medium: A test of the standard QED Hamiltonian",

abstract = "Because of the possibility of manipulating the spontaneous decay rate of active atoms embedded in a dielectric medium, there has recently, been great interest in studying the behavior of these atoms. The decay rate of the atoms warrants special study as it is affected by additional physical factors not present in cavity QED. It is shown that the usual value given for one of these additional factors is incorrect, and the correct value can be related to a basic property of the standard QED Hamiltonian.",

author = "Ho, \{S. T.\} and Prem Kumar",

year = "1990",

month = dec,

day = "1",

language = "English (US)",

booktitle = "XVII International Conference on Quantum Electronics. Digest of",

publisher = "Publ by IEEE",

note = "17th International Conference on Quantum Electronics - IQEC '90 ; Conference date: 21-05-1990 Through 25-05-1990",

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TY - GEN

T1 - Atomic decay rates in a dielectric medium

T2 - 17th International Conference on Quantum Electronics - IQEC '90

AU - Ho, S. T.

AU - Kumar, Prem

PY - 1990/12/1

Y1 - 1990/12/1

N2 - Because of the possibility of manipulating the spontaneous decay rate of active atoms embedded in a dielectric medium, there has recently, been great interest in studying the behavior of these atoms. The decay rate of the atoms warrants special study as it is affected by additional physical factors not present in cavity QED. It is shown that the usual value given for one of these additional factors is incorrect, and the correct value can be related to a basic property of the standard QED Hamiltonian.

AB - Because of the possibility of manipulating the spontaneous decay rate of active atoms embedded in a dielectric medium, there has recently, been great interest in studying the behavior of these atoms. The decay rate of the atoms warrants special study as it is affected by additional physical factors not present in cavity QED. It is shown that the usual value given for one of these additional factors is incorrect, and the correct value can be related to a basic property of the standard QED Hamiltonian.

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UR - http://www.scopus.com/inward/citedby.url?scp=0025554891&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:0025554891

BT - XVII International Conference on Quantum Electronics. Digest of

PB - Publ by IEEE

Y2 - 21 May 1990 through 25 May 1990

ER -

Atomic decay rates in a dielectric medium: A test of the standard QED Hamiltonian

Abstract

Other

ASJC Scopus subject areas

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