Atomic decay rates in a dielectric medium: A test of the standard QED Hamiltonian

S. T. Ho*, Prem Kumar

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Because of the possibility of manipulating the spontaneous decay rate of active atoms embedded in a dielectric medium, there has recently, been great interest in studying the behavior of these atoms. The decay rate of the atoms warrants special study as it is affected by additional physical factors not present in cavity QED. It is shown that the usual value given for one of these additional factors is incorrect, and the correct value can be related to a basic property of the standard QED Hamiltonian.

Original languageEnglish (US)
Title of host publicationXVII International Conference on Quantum Electronics. Digest of
PublisherPubl by IEEE
Number of pages1
StatePublished - Dec 1 1990
Event17th International Conference on Quantum Electronics - IQEC '90 - Anaheim, CA, USA
Duration: May 21 1990May 25 1990

Other

Other17th International Conference on Quantum Electronics - IQEC '90
CityAnaheim, CA, USA
Period5/21/905/25/90

ASJC Scopus subject areas

  • Engineering(all)

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