Atomic force microscopy of nickel dot arrays with tuning fork and nanotube probe

S. Rozhok; S. Jung; V. Chandrasekhar; Xiwei Lin; Vinayak P. Dravid

doi:10.1116/1.1539066

Atomic force microscopy of nickel dot arrays with tuning fork and nanotube probe

S. Rozhok, S. Jung, V. Chandrasekhar^*, Xiwei Lin, Vinayak P. Dravid

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

10 Scopus citations

Abstract

A combination of a tuning fork and a carbon nanotube mounted to the end of commercial cantilever provides 26% better resolution compared to regular commercial cantilevers. It is shown that the use of a tuning fork and carbon nanotube opens new possibilities in the study of objects in different environments.

Original language	English (US)
Pages (from-to)	323-325
Number of pages	3
Journal	Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
Volume	21
Issue number	1 SPEC.
DOIs	https://doi.org/10.1116/1.1539066
State	Published - Jan 2003

ASJC Scopus subject areas

Condensed Matter Physics
Electrical and Electronic Engineering

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title = "Atomic force microscopy of nickel dot arrays with tuning fork and nanotube probe",

abstract = "A combination of a tuning fork and a carbon nanotube mounted to the end of commercial cantilever provides 26% better resolution compared to regular commercial cantilevers. It is shown that the use of a tuning fork and carbon nanotube opens new possibilities in the study of objects in different environments.",

author = "S. Rozhok and S. Jung and V. Chandrasekhar and Xiwei Lin and Dravid, {Vinayak P.}",

year = "2003",

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AU - Rozhok, S.

AU - Jung, S.

AU - Chandrasekhar, V.

AU - Lin, Xiwei

AU - Dravid, Vinayak P.

PY - 2003/1

Y1 - 2003/1

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AB - A combination of a tuning fork and a carbon nanotube mounted to the end of commercial cantilever provides 26% better resolution compared to regular commercial cantilevers. It is shown that the use of a tuning fork and carbon nanotube opens new possibilities in the study of objects in different environments.

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SN - 1071-1023

VL - 21

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JF - Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

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ER -

Atomic force microscopy of nickel dot arrays with tuning fork and nanotube probe

Abstract

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