Atomic force microscopy of nickel dot arrays with tuning fork and nanotube probe

S. Rozhok, S. Jung, Venkat Chandrasekhar*, Xiwei Lin, Vinayak P Dravid

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

9 Scopus citations

Abstract

A combination of a tuning fork and a carbon nanotube mounted to the end of commercial cantilever provides 26% better resolution compared to regular commercial cantilevers. It is shown that the use of a tuning fork and carbon nanotube opens new possibilities in the study of objects in different environments.

Original languageEnglish (US)
Pages (from-to)323-325
Number of pages3
JournalJournal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
Volume21
Issue number1 SPEC.
DOIs
StatePublished - Jan 1 2003

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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