Atomic force photovoltaic microscopy

Benjamin J. Leever; Liam S C Pingree; Alexander W. Hains; Michael D. Irwin; Tobin Jay Marks; Mark Hersam

Atomic force photovoltaic microscopy

Benjamin J. Leever^*, Liam S C Pingree, Alexander W. Hains, Michael D. Irwin, Tobin Jay Marks, Mark Hersam

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

A new conductive atomic force microscopy (AFM) technique, called atomic force photovoltaic microscopy, has been developed to characterize localized variations in the performance of organic photovoltaic devices. The technique works by illuminating microscopic solar cells with either broadband or narrowband light sources while injecting them with current through a conductive AFM probe. Sample biases ranging from -20V to +15 V have been applied in combination with simple lamps, lasers, and solar simulated light to generate current ranging from <1 pA to nearly 1 μ A. Simultaneous topographic and current maps are generated, and IV characteristics (including key figures of merit such as power conversion efficiency) can be determined for single cells. Preliminary data including evidence of localized variations in open circuit voltage are presented.

Original language	English (US)
Title of host publication	233rd ACS National Meeting, Abstracts of Scientific Papers
State	Published - Dec 28 2007
Event	233rd ACS National Meeting - Chicago, IL, United States Duration: Mar 25 2007 → Mar 29 2007

Other

Other	233rd ACS National Meeting
Country/Territory	United States
City	Chicago, IL
Period	3/25/07 → 3/29/07

ASJC Scopus subject areas

Chemistry(all)

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

Cite this

@inproceedings{4ef6e3116da44d5a887073f84cc8a166,

title = "Atomic force photovoltaic microscopy",

abstract = "A new conductive atomic force microscopy (AFM) technique, called atomic force photovoltaic microscopy, has been developed to characterize localized variations in the performance of organic photovoltaic devices. The technique works by illuminating microscopic solar cells with either broadband or narrowband light sources while injecting them with current through a conductive AFM probe. Sample biases ranging from -20V to +15 V have been applied in combination with simple lamps, lasers, and solar simulated light to generate current ranging from <1 pA to nearly 1 μ A. Simultaneous topographic and current maps are generated, and IV characteristics (including key figures of merit such as power conversion efficiency) can be determined for single cells. Preliminary data including evidence of localized variations in open circuit voltage are presented.",

author = "Leever, {Benjamin J.} and Pingree, {Liam S C} and Hains, {Alexander W.} and Irwin, {Michael D.} and Marks, {Tobin Jay} and Mark Hersam",

year = "2007",

month = dec,

day = "28",

language = "English (US)",

isbn = "084127438X",

booktitle = "233rd ACS National Meeting, Abstracts of Scientific Papers",

note = "233rd ACS National Meeting ; Conference date: 25-03-2007 Through 29-03-2007",

}

TY - GEN

T1 - Atomic force photovoltaic microscopy

AU - Leever, Benjamin J.

AU - Pingree, Liam S C

AU - Hains, Alexander W.

AU - Irwin, Michael D.

AU - Marks, Tobin Jay

AU - Hersam, Mark

PY - 2007/12/28

Y1 - 2007/12/28

N2 - A new conductive atomic force microscopy (AFM) technique, called atomic force photovoltaic microscopy, has been developed to characterize localized variations in the performance of organic photovoltaic devices. The technique works by illuminating microscopic solar cells with either broadband or narrowband light sources while injecting them with current through a conductive AFM probe. Sample biases ranging from -20V to +15 V have been applied in combination with simple lamps, lasers, and solar simulated light to generate current ranging from <1 pA to nearly 1 μ A. Simultaneous topographic and current maps are generated, and IV characteristics (including key figures of merit such as power conversion efficiency) can be determined for single cells. Preliminary data including evidence of localized variations in open circuit voltage are presented.

AB - A new conductive atomic force microscopy (AFM) technique, called atomic force photovoltaic microscopy, has been developed to characterize localized variations in the performance of organic photovoltaic devices. The technique works by illuminating microscopic solar cells with either broadband or narrowband light sources while injecting them with current through a conductive AFM probe. Sample biases ranging from -20V to +15 V have been applied in combination with simple lamps, lasers, and solar simulated light to generate current ranging from <1 pA to nearly 1 μ A. Simultaneous topographic and current maps are generated, and IV characteristics (including key figures of merit such as power conversion efficiency) can be determined for single cells. Preliminary data including evidence of localized variations in open circuit voltage are presented.

UR - http://www.scopus.com/inward/record.url?scp=37349083855&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=37349083855&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:37349083855

SN - 084127438X

SN - 9780841274389

BT - 233rd ACS National Meeting, Abstracts of Scientific Papers

T2 - 233rd ACS National Meeting

Y2 - 25 March 2007 through 29 March 2007

ER -

Atomic force photovoltaic microscopy

Abstract

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ASJC Scopus subject areas

UN SDGs

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