Atomic imaging of surfaces in plan view

P. Xu; D. Dunn; J. P. Zhang; L. D. Marks

doi:10.1016/0039-6028(93)90904-X

Atomic imaging of surfaces in plan view

P. Xu^*, D. Dunn, J. P. Zhang, L. D. Marks

^*Corresponding author for this work

Materials Science and Engineering

Research output: Contribution to journal › Article › peer-review

19 Scopus citations

Abstract

We report experimental results imaging the surface diffraction spots in the plan view geometry from the Si(111) surface and the Ir(001) surface. High quality images have been obtained using conventional large aperture high resolution electron microscopy (HREM), a smaller aperture to exclude the bulk diffraction spots and with highly tilted crystals. The experimental data indicates that there should be no major problems in obtaining atomic scale surface information in plan view.

Original language	English (US)
Pages (from-to)	L479-L485
Journal	Surface Science
Volume	285
Issue number	1-2
DOIs	https://doi.org/10.1016/0039-6028(93)90904-X
State	Published - Apr 1 1993

ASJC Scopus subject areas

Condensed Matter Physics
Surfaces and Interfaces
Surfaces, Coatings and Films
Materials Chemistry

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10.1016/0039-6028(93)90904-X

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@article{8d22694d8d714fa2a832eeac5984e486,

title = "Atomic imaging of surfaces in plan view",

abstract = "We report experimental results imaging the surface diffraction spots in the plan view geometry from the Si(111) surface and the Ir(001) surface. High quality images have been obtained using conventional large aperture high resolution electron microscopy (HREM), a smaller aperture to exclude the bulk diffraction spots and with highly tilted crystals. The experimental data indicates that there should be no major problems in obtaining atomic scale surface information in plan view.",

author = "P. Xu and D. Dunn and Zhang, {J. P.} and Marks, {L. D.}",

note = "Funding Information: This work was supportedb y the Airforce Office of Scientific Research on grant number AFOSR 90-0045O. ne of us (D.N.D.) would also like to acknowkedges upport from the National Science Foundation on grant number DMR-85-20280.",

year = "1993",

month = apr,

day = "1",

doi = "10.1016/0039-6028(93)90904-X",

language = "English (US)",

volume = "285",

pages = "L479--L485",

journal = "Surface Science",

issn = "0039-6028",

publisher = "Elsevier B.V.",

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TY - JOUR

T1 - Atomic imaging of surfaces in plan view

AU - Xu, P.

AU - Dunn, D.

AU - Zhang, J. P.

AU - Marks, L. D.

N1 - Funding Information: This work was supportedb y the Airforce Office of Scientific Research on grant number AFOSR 90-0045O. ne of us (D.N.D.) would also like to acknowkedges upport from the National Science Foundation on grant number DMR-85-20280.

PY - 1993/4/1

Y1 - 1993/4/1

N2 - We report experimental results imaging the surface diffraction spots in the plan view geometry from the Si(111) surface and the Ir(001) surface. High quality images have been obtained using conventional large aperture high resolution electron microscopy (HREM), a smaller aperture to exclude the bulk diffraction spots and with highly tilted crystals. The experimental data indicates that there should be no major problems in obtaining atomic scale surface information in plan view.

AB - We report experimental results imaging the surface diffraction spots in the plan view geometry from the Si(111) surface and the Ir(001) surface. High quality images have been obtained using conventional large aperture high resolution electron microscopy (HREM), a smaller aperture to exclude the bulk diffraction spots and with highly tilted crystals. The experimental data indicates that there should be no major problems in obtaining atomic scale surface information in plan view.

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UR - http://www.scopus.com/inward/citedby.url?scp=0027573878&partnerID=8YFLogxK

U2 - 10.1016/0039-6028(93)90904-X

DO - 10.1016/0039-6028(93)90904-X

M3 - Article

AN - SCOPUS:0027573878

SN - 0039-6028

VL - 285

SP - L479-L485

JO - Surface Science

JF - Surface Science

IS - 1-2

ER -

Atomic imaging of surfaces in plan view

Abstract

ASJC Scopus subject areas

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