Atomic-resolution characterization of a SrTiO3 grain boundary in the stem

M. M. McGibbon*, N. D. Browning, M. F. Chisholm, A. J. McGibbon, S. J. Pennycook, V. Ravikumar, V. P. Dravid

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations


High-resolution Z-contrast imaging in the scanning transmission electron microscope (STEM) forms an incoherent image where changes in atomic structure and composition across an interface can be interpreted intuitively. Parallel detection energy loss spectroscopy (PEELS) can be used simultaneously to provide complementary chemical information on an atomic scale. The fine structure in the PEEL spectra can be used to investigate the local electronic structure and the nature of the bonding across the interface. The complimentary techniques of high resolution Z-contrast imaging and PEELS are used in investigating the atomic structure and chemistry of a 25 degree symmetric tilt boundary in a bicrystal of the electroceramic SrTiO3.

Original languageEnglish (US)
Title of host publicationProceedings - Annual Meeting, Microscopy Society of America
EditorsG.W. Bailey, A.J. Garratt-Reed
Number of pages2
StatePublished - Dec 1 1994
EventProceedings of the 52nd Annual Meeting of the Microscopy Society of America - New Orleans, LA, USA
Duration: Jul 31 1994Aug 5 1994


OtherProceedings of the 52nd Annual Meeting of the Microscopy Society of America
CityNew Orleans, LA, USA

ASJC Scopus subject areas

  • Engineering(all)

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