Atomic-resolution characterization of a SrTiO3 grain boundary in the stem

M. M. McGibbon; N. D. Browning; M. F. Chisholm; A. J. McGibbon; S. J. Pennycook; V. Ravikumar; V. P. Dravid

Atomic-resolution characterization of a SrTiO₃ grain boundary in the stem

M. M. McGibbon^*, N. D. Browning, M. F. Chisholm, A. J. McGibbon, S. J. Pennycook, V. Ravikumar, V. P. Dravid

^*Corresponding author for this work

Materials Science and Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Scopus citations

Abstract

High-resolution Z-contrast imaging in the scanning transmission electron microscope (STEM) forms an incoherent image where changes in atomic structure and composition across an interface can be interpreted intuitively. Parallel detection energy loss spectroscopy (PEELS) can be used simultaneously to provide complementary chemical information on an atomic scale. The fine structure in the PEEL spectra can be used to investigate the local electronic structure and the nature of the bonding across the interface. The complimentary techniques of high resolution Z-contrast imaging and PEELS are used in investigating the atomic structure and chemistry of a 25 degree symmetric tilt boundary in a bicrystal of the electroceramic SrTiO₃.

Original language	English (US)
Title of host publication	Proceedings - Annual Meeting, Microscopy Society of America
Editors	G.W. Bailey, A.J. Garratt-Reed
Pages	972-973
Number of pages	2
State	Published - Dec 1 1994
Event	Proceedings of the 52nd Annual Meeting of the Microscopy Society of America - New Orleans, LA, USA Duration: Jul 31 1994 → Aug 5 1994

Other

Other	Proceedings of the 52nd Annual Meeting of the Microscopy Society of America
City	New Orleans, LA, USA
Period	7/31/94 → 8/5/94

ASJC Scopus subject areas

Engineering(all)

Cite this

@inproceedings{90c369db290d4a3aa084fbcd015218bc,

title = "Atomic-resolution characterization of a SrTiO3 grain boundary in the stem",

abstract = "High-resolution Z-contrast imaging in the scanning transmission electron microscope (STEM) forms an incoherent image where changes in atomic structure and composition across an interface can be interpreted intuitively. Parallel detection energy loss spectroscopy (PEELS) can be used simultaneously to provide complementary chemical information on an atomic scale. The fine structure in the PEEL spectra can be used to investigate the local electronic structure and the nature of the bonding across the interface. The complimentary techniques of high resolution Z-contrast imaging and PEELS are used in investigating the atomic structure and chemistry of a 25 degree symmetric tilt boundary in a bicrystal of the electroceramic SrTiO3.",

author = "McGibbon, {M. M.} and Browning, {N. D.} and Chisholm, {M. F.} and McGibbon, {A. J.} and Pennycook, {S. J.} and V. Ravikumar and Dravid, {V. P.}",

year = "1994",

month = dec,

day = "1",

language = "English (US)",

pages = "972--973",

editor = "G.W. Bailey and A.J. Garratt-Reed",

booktitle = "Proceedings - Annual Meeting, Microscopy Society of America",

note = "Proceedings of the 52nd Annual Meeting of the Microscopy Society of America ; Conference date: 31-07-1994 Through 05-08-1994",

}

McGibbon, MM, Browning, ND, Chisholm, MF, McGibbon, AJ, Pennycook, SJ, Ravikumar, V & Dravid, VP 1994, Atomic-resolution characterization of a SrTiO₃ grain boundary in the stem. in GW Bailey & AJ Garratt-Reed (eds), Proceedings - Annual Meeting, Microscopy Society of America. pp. 972-973, Proceedings of the 52nd Annual Meeting of the Microscopy Society of America, New Orleans, LA, USA, 7/31/94.

TY - GEN

T1 - Atomic-resolution characterization of a SrTiO3 grain boundary in the stem

AU - McGibbon, M. M.

AU - Browning, N. D.

AU - Chisholm, M. F.

AU - McGibbon, A. J.

AU - Pennycook, S. J.

AU - Ravikumar, V.

AU - Dravid, V. P.

PY - 1994/12/1

Y1 - 1994/12/1

N2 - High-resolution Z-contrast imaging in the scanning transmission electron microscope (STEM) forms an incoherent image where changes in atomic structure and composition across an interface can be interpreted intuitively. Parallel detection energy loss spectroscopy (PEELS) can be used simultaneously to provide complementary chemical information on an atomic scale. The fine structure in the PEEL spectra can be used to investigate the local electronic structure and the nature of the bonding across the interface. The complimentary techniques of high resolution Z-contrast imaging and PEELS are used in investigating the atomic structure and chemistry of a 25 degree symmetric tilt boundary in a bicrystal of the electroceramic SrTiO3.

AB - High-resolution Z-contrast imaging in the scanning transmission electron microscope (STEM) forms an incoherent image where changes in atomic structure and composition across an interface can be interpreted intuitively. Parallel detection energy loss spectroscopy (PEELS) can be used simultaneously to provide complementary chemical information on an atomic scale. The fine structure in the PEEL spectra can be used to investigate the local electronic structure and the nature of the bonding across the interface. The complimentary techniques of high resolution Z-contrast imaging and PEELS are used in investigating the atomic structure and chemistry of a 25 degree symmetric tilt boundary in a bicrystal of the electroceramic SrTiO3.

UR - http://www.scopus.com/inward/record.url?scp=0028737892&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0028737892&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:0028737892

SP - 972

EP - 973

BT - Proceedings - Annual Meeting, Microscopy Society of America

A2 - Bailey, G.W.

A2 - Garratt-Reed, A.J.

T2 - Proceedings of the 52nd Annual Meeting of the Microscopy Society of America

Y2 - 31 July 1994 through 5 August 1994

ER -

Atomic-resolution characterization of a SrTiO₃ grain boundary in the stem

Abstract

Other

ASJC Scopus subject areas

Other files and links

Fingerprint

Cite this