Atomic-resolution characterization of the effects of CdCl2 treatment on poly-crystalline CdTe thin films

T. Paulauskas*, C. Buurma, E. Colegrove, Z. Guo, S. Sivananthan, M. K.Y. Chan, R. F. Klie

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

23 Scopus citations

Abstract

Poly-crystalline CdTe thin films on glass are used in commercial solar-cell superstrate devices. It is well known that post-deposition annealing of the CdTe thin films in a CdCl2 environment significantly increases the device performance, but a fundamental understanding of the effects of such annealing has not been achieved. In this Letter, we report a change in the stoichiometry across twin boundaries in CdTe and propose that native point defects alone cannot account for this variation. Upon annealing in CdCl 2, we find that the stoichiometry is restored. Our experimental measurements using atomic-resolution high-angle annular dark field imaging, electron energy-loss spectroscopy, and energy dispersive X-ray spectroscopy in a scanning transmission electron microscope are supported by first-principles density functional theory calculations.

Original languageEnglish (US)
Article number071910
JournalApplied Physics Letters
Volume105
Issue number7
DOIs
StatePublished - Aug 18 2014

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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