Atomic resolution transmission electron microscopy of surfaces

Ann N. Chiaramonti, Laurence D. Marks*

*Corresponding author for this work

Research output: Contribution to journalReview articlepeer-review

10 Scopus citations

Abstract

A brief overview of transmission electron microscopy as it applies specifically to obtaining surface crystallographic information is presented. This review will encompass many of the practical aspects of obtaining surface crystal information from a transmission electron microscope, including equipment requirements, experimental techniques, sample preparation methods, data extraction and image processing, and complimentary techniques.

Original languageEnglish (US)
Pages (from-to)1619-1627
Number of pages9
JournalJournal of Materials Research
Volume20
Issue number7
DOIs
StatePublished - Jul 2005

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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