Atomic resolution transmission electron microscopy of surfaces

Ann N. Chiaramonti; Laurence D. Marks

doi:10.1557/JMR.2005.0211

Atomic resolution transmission electron microscopy of surfaces

Ann N. Chiaramonti, Laurence D. Marks^*

^*Corresponding author for this work

Materials Science and Engineering

Research output: Contribution to journal › Review article › peer-review

12 Scopus citations

Abstract

A brief overview of transmission electron microscopy as it applies specifically to obtaining surface crystallographic information is presented. This review will encompass many of the practical aspects of obtaining surface crystal information from a transmission electron microscope, including equipment requirements, experimental techniques, sample preparation methods, data extraction and image processing, and complimentary techniques.

Original language	English (US)
Pages (from-to)	1619-1627
Number of pages	9
Journal	Journal of Materials Research
Volume	20
Issue number	7
DOIs	https://doi.org/10.1557/JMR.2005.0211
State	Published - Jul 2005

ASJC Scopus subject areas

General Materials Science
Condensed Matter Physics
Mechanics of Materials
Mechanical Engineering

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10.1557/JMR.2005.0211

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title = "Atomic resolution transmission electron microscopy of surfaces",

abstract = "A brief overview of transmission electron microscopy as it applies specifically to obtaining surface crystallographic information is presented. This review will encompass many of the practical aspects of obtaining surface crystal information from a transmission electron microscope, including equipment requirements, experimental techniques, sample preparation methods, data extraction and image processing, and complimentary techniques.",

author = "Chiaramonti, {Ann N.} and Marks, {Laurence D.}",

note = "Funding Information: This work was supported by the Chemical Sciences, Geosciences, and Biosciences Division, Office of Basic Energy Sciences, Office of Science, United States Department of Energy, Grant No. DE-FG02-03ER15457.",

year = "2005",

month = jul,

doi = "10.1557/JMR.2005.0211",

language = "English (US)",

volume = "20",

pages = "1619--1627",

journal = "Journal of Materials Research",

issn = "0884-2914",

publisher = "Springer International Publishing AG",

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TY - JOUR

T1 - Atomic resolution transmission electron microscopy of surfaces

AU - Chiaramonti, Ann N.

AU - Marks, Laurence D.

N1 - Funding Information: This work was supported by the Chemical Sciences, Geosciences, and Biosciences Division, Office of Basic Energy Sciences, Office of Science, United States Department of Energy, Grant No. DE-FG02-03ER15457.

PY - 2005/7

Y1 - 2005/7

N2 - A brief overview of transmission electron microscopy as it applies specifically to obtaining surface crystallographic information is presented. This review will encompass many of the practical aspects of obtaining surface crystal information from a transmission electron microscope, including equipment requirements, experimental techniques, sample preparation methods, data extraction and image processing, and complimentary techniques.

AB - A brief overview of transmission electron microscopy as it applies specifically to obtaining surface crystallographic information is presented. This review will encompass many of the practical aspects of obtaining surface crystal information from a transmission electron microscope, including equipment requirements, experimental techniques, sample preparation methods, data extraction and image processing, and complimentary techniques.

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JO - Journal of Materials Research

JF - Journal of Materials Research

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Atomic resolution transmission electron microscopy of surfaces

Abstract

ASJC Scopus subject areas

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