Abstract
We report on the distribution of micro-alloying elements in a multi-component TiAl-based alloy. The specimen contains 3 at.% Nb, 1.5 at.% Cr, 0.5 at.% Mn, 0.6 at.% (W + Hf + Zr), and 0.2 at.% each of B, C, and O. The distributions of all micro-alloying elements with respect to the heterophase interface between α2 and γ lamellae are analyzed with a three-dimensional atom-probe (3DAP) microscope. All the elements partition except boron, which resides primarily in boride precipitates. Oxygen, C, Mn, and Cr partition to the α2-phase, whereas Nb and Zr partition to the γ-phase. Both W and Hf exhibit excess concentration values within ca. 7 nm of the lamellar interface in the α2-phase, and their near interfacial excesses are 0.26 and 0.35 atoms nm-2, respectively.
Original language | English (US) |
---|---|
Pages (from-to) | 303-310 |
Number of pages | 8 |
Journal | Interface Science |
Volume | 12 |
Issue number | 2-3 |
DOIs | |
State | Published - Apr 1 2004 |
Keywords
- Interface
- Interfacial excess
- Partitioning
- Proxigram
- TiAl
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Materials Science(all)
- Condensed Matter Physics