Atomic-scale observation of polarization switching in epitaxial ferroelectric thin films

D. L. Marasco*, A. Kazimirov, M. J. Bedzyk, T. L. Lee, S. K. Streiffer, O. Auciello, G. R. Bai

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

10 Scopus citations


The thin-film x-ray standing wave (XSW) technique is used for an atomic-scale study of polarization switching in ferroelectric Pb(Zr0.3Ti0.7)O3 (PZT)/electrode heterostructures grown on SrTiO3(001). The XSW is selectively generated in the PZT by the interference between the incident x-ray wave and the weak (001) Bragg diffracted wave from the film. The XSW excites a fluorescence signal from the Pb ions in the PZT film, that is used to determine their subangström displacements after polarization switching has occurred. This experimental method yields unique information on the underlying atomic configurations for different polarization domain states.

Original languageEnglish (US)
Pages (from-to)515-517
Number of pages3
JournalApplied Physics Letters
Issue number4
StatePublished - Jul 23 2001
Externally publishedYes

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)


Dive into the research topics of 'Atomic-scale observation of polarization switching in epitaxial ferroelectric thin films'. Together they form a unique fingerprint.

Cite this