Atomic-scale roughness effect on capillary force in atomic force microscopy

Joonkyung Jang; M. A. Ratner; George C. Schatz

doi:10.1021/jp056554b

Atomic-scale roughness effect on capillary force in atomic force microscopy

Joonkyung Jang^*, M. A. Ratner, George C. Schatz

^*Corresponding author for this work

Chemistry

Research output: Contribution to journal › Article › peer-review

46 Scopus citations

Abstract

We study the capillary force in atomic force microscopy by using Monte Carlo simulations. Adopting a lattice gas model for water, we simulated water menisci that form between a rough silicon-nitride tip and a mica surface. Unlike its macroscopic counterpart, the water meniscus at the nanoscale gives rise to a capillary force that responds sensitively to the tip roughness. With only a slight change in tip shape, the pull-off force significantly changes its qualitative variation with humidity.

Original language	English (US)
Pages (from-to)	659-662
Number of pages	4
Journal	Journal of Physical Chemistry B
Volume	110
Issue number	2
DOIs	https://doi.org/10.1021/jp056554b
State	Published - Jan 19 2006

ASJC Scopus subject areas

Materials Chemistry
Surfaces, Coatings and Films
Physical and Theoretical Chemistry

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Atomic-scale roughness effect on capillary force in atomic force microscopy

Abstract

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