Atomic scale studies of segregation at ceramic/metal heterophase interfaces

D. A. Shashkov*, David N Seidman

*Corresponding author for this work

Research output: Contribution to journalArticle

36 Citations (Scopus)

Abstract

Atom-probe field-ion microscopy was used to measure quantitatively γAg, the absolute values of the Gibbsian interfacial excess of Ag, at semicoherent MgO/Cu(Ag) {222} heterophase interfaces. Atomically clean metal oxide/metal heterophase interfaces were obtained by internal oxidation of a pure ternary Cu(Mg,Ag) single-phase alloy to produce octahedral-shaped MgO precipitates, 10 to 30 nm in diameter, in a single-phase Cu(Ag) matrix. The measured value of γAg at 500°C is (2±0.6)×1015 atoms cm-2.

Original languageEnglish (US)
Pages (from-to)268-271
Number of pages4
JournalPhysical Review Letters
Volume75
Issue number2
DOIs
StatePublished - Jan 1 1995

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ceramics
metals
metal oxides
atoms
precipitates
microscopy
oxidation
probes
matrices
ions

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

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Atomic scale studies of segregation at ceramic/metal heterophase interfaces. / Shashkov, D. A.; Seidman, David N.

In: Physical Review Letters, Vol. 75, No. 2, 01.01.1995, p. 268-271.

Research output: Contribution to journalArticle

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AB - Atom-probe field-ion microscopy was used to measure quantitatively γAg, the absolute values of the Gibbsian interfacial excess of Ag, at semicoherent MgO/Cu(Ag) {222} heterophase interfaces. Atomically clean metal oxide/metal heterophase interfaces were obtained by internal oxidation of a pure ternary Cu(Mg,Ag) single-phase alloy to produce octahedral-shaped MgO precipitates, 10 to 30 nm in diameter, in a single-phase Cu(Ag) matrix. The measured value of γAg at 500°C is (2±0.6)×1015 atoms cm-2.

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