TY - JOUR
T1 - Atomic scale studies of segregation at ceramic/metal heterophase interfaces
AU - Shashkov, D. A.
AU - Seidman, D. N.
PY - 1995
Y1 - 1995
N2 - Atom-probe field-ion microscopy was used to measure quantitatively γAg, the absolute values of the Gibbsian interfacial excess of Ag, at semicoherent MgO/Cu(Ag) {222} heterophase interfaces. Atomically clean metal oxide/metal heterophase interfaces were obtained by internal oxidation of a pure ternary Cu(Mg,Ag) single-phase alloy to produce octahedral-shaped MgO precipitates, 10 to 30 nm in diameter, in a single-phase Cu(Ag) matrix. The measured value of γAg at 500°C is (2±0.6)×1015 atoms cm-2.
AB - Atom-probe field-ion microscopy was used to measure quantitatively γAg, the absolute values of the Gibbsian interfacial excess of Ag, at semicoherent MgO/Cu(Ag) {222} heterophase interfaces. Atomically clean metal oxide/metal heterophase interfaces were obtained by internal oxidation of a pure ternary Cu(Mg,Ag) single-phase alloy to produce octahedral-shaped MgO precipitates, 10 to 30 nm in diameter, in a single-phase Cu(Ag) matrix. The measured value of γAg at 500°C is (2±0.6)×1015 atoms cm-2.
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U2 - 10.1103/PhysRevLett.75.268
DO - 10.1103/PhysRevLett.75.268
M3 - Article
C2 - 10059651
AN - SCOPUS:0000464555
SN - 0031-9007
VL - 75
SP - 268
EP - 271
JO - Physical Review Letters
JF - Physical Review Letters
IS - 2
ER -