Atomic scale studies of silver segregation at {222} MgO/Cu heterophase interfaces

D. A. Shashkov*, D. N. Seidman

*Corresponding author for this work

Research output: Contribution to journalArticle

6 Scopus citations

Abstract

Atom-probe field-ion microscopy (APFIM) was used to measure quantitatively the absolute values of the Gibbsian interfacial excess of Ag, ΓAg, at semi-coherent {222} MgO/Cu(Ag) heterophase interfaces. Atomically clean metal oxide/metal heterophase interfaces were obtained by internal oxidation of a pure ternary Cu(Mg, Ag) single-phase alloy to produce octahedral-shaped MgO precipitates, 10 to 30 nm in diameter and faceted on {222} panes, in a single-phase Cu(Ag) matrix. The measured value of ΓAg, at 500°C is (2±0.6)×1015 atoms cm-2.

Original languageEnglish (US)
Pages (from-to)429-432
Number of pages4
JournalMaterials Science Forum
Volume207-209
Issue numberPART 1
DOIs
StatePublished - Jan 1 1996

Keywords

  • Atom-Probe Field-Ion Microscopy
  • Ceramic/Metal Interface
  • Cu/MgO
  • Equilibrium Segregation
  • Gibbsian Interfacial Excess
  • Internal Oxidation
  • Precipitate

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

Fingerprint Dive into the research topics of 'Atomic scale studies of silver segregation at {222} MgO/Cu heterophase interfaces'. Together they form a unique fingerprint.

Cite this