Abstract
Atom-probe field-ion microscopy (APFIM) was used to measure quantitatively the absolute values of the Gibbsian interfacial excess of Ag, ΓAg, at semi-coherent {222} MgO/Cu(Ag) heterophase interfaces. Atomically clean metal oxide/metal heterophase interfaces were obtained by internal oxidation of a pure ternary Cu(Mg, Ag) single-phase alloy to produce octahedral-shaped MgO precipitates, 10 to 30 nm in diameter and faceted on {222} panes, in a single-phase Cu(Ag) matrix. The measured value of ΓAg, at 500°C is (2±0.6)×1015 atoms cm-2.
Original language | English (US) |
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Pages (from-to) | 429-432 |
Number of pages | 4 |
Journal | Materials Science Forum |
Volume | 207-209 |
Issue number | PART 1 |
DOIs | |
State | Published - 1996 |
Keywords
- Atom-Probe Field-Ion Microscopy
- Ceramic/Metal Interface
- Cu/MgO
- Equilibrium Segregation
- Gibbsian Interfacial Excess
- Internal Oxidation
- Precipitate
ASJC Scopus subject areas
- General Materials Science
- Condensed Matter Physics
- Mechanics of Materials
- Mechanical Engineering