Atomic-scale studies of silver segregation at MgO/Cu heterophase interfaces

D. A. Shashkov*, D. N. Seidman

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

15 Scopus citations


Atom-probe field-ion microscopy (APFIM) is used to measure quantitatively the absolute values of the Gibbsian interfacial excess of Ag, Γ Ag , at semi-coherent {222} MgO/Cu(Ag) heterophase interfaces. Atomically clean metal oxide/metal heterophase interfaces were obtained by internal oxidation of a pure ternary Cu(Mg,Ag) single-phase alloy to produce octahedral-shaped MgO precipitates, 10 to 30 nm in diameter, in a single-phase Cu(Ag) matrix. Precipitates are faceted on {222} planes. Random-area APFIM analysis was performed in the 〈111〉 direction of the Cu(Ag) matrix, perpendicular to one pair of {222} facets of every MgO precipitate. For a single precipitate dissected on an atomic scale, segregation levels at both "front" and "rear" interfaces are determined. The average measured value of Γ Ag , at 500 °C, is (2 ± 0.6) × 10 15 atoms cm -2 . This corresponds to about one monolayer coverage.

Original languageEnglish (US)
Pages (from-to)416-421
Number of pages6
JournalApplied Surface Science
StatePublished - Mar 1996

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Surfaces, Coatings and Films
  • Surfaces and Interfaces


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