Atomic-scale studies of the electronic structure of ceramic/metal interfaces: {222}MgO/Cu

D. A. Muller*, D. A. Shashkov, R. Benedek, L. H. Yang, J. Silcox, D. N. Seidman

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

4 Scopus citations

Abstract

{222} MgO/Cu interfaces produced by internal oxidation are studied by electron energy loss spectroscopy (EELS) using an atomic sized electron beam. We determine interfacial chemistry of this interface with subnanometer spatial resolution and use EELS to measure directly the electronic states pertaining to the buried interface. The O-K edge gives evidence of metal-induced gap states (MIGS) within the bandgap of MgO, at the interface, which we find to be O terminated. Both experiment and ab initio calculations show the MIGS to be strongly localized at the interface.

Original languageEnglish (US)
Pages (from-to)99-102
Number of pages4
JournalMaterials Science Forum
Volume294-296
StatePublished - Jan 1 1999

Keywords

  • Ceramic/Metal Heterophase Interfaces
  • Electron Energy Loss Spectroscopy
  • Electronic Structure of Interfaces
  • Local Density Functional Theory
  • {111}MgO/Cu Heterophase Interfaces

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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