Atomic - Scale study of model CdTe grain boundaries

Tadas Paulauskas; Fatih Sen; Cyrus Sun; Edward Barnard; Moon Kim; Sivananthan Sivalingham; Maria Chan; Robert Klie

doi:10.1109/PVSC.2017.8366877

Atomic - Scale study of model CdTe grain boundaries

Tadas Paulauskas, Fatih Sen, Cyrus Sun, Edward Barnard, Moon Kim, Sivananthan Sivalingham, Maria Chan, Robert Klie

MRC - Materials Research Center

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

Poly-crystalline CdTe-based thin film photovoltaic (PV) devices are the forerunners in commercialized solar cell technology. Despite the commercial success, best laboratory cells achieve ∼21.5% power conversion efficiency and hence are still ∼10% short of theoretical limit. In this collaborative research project we investigate effects of the grain boundaries via wafer- bonded CdTe bicrystals. Lifetime measurements are carried out using two-photon absorption, while atomic resolution imaging and first-principles calculations are used to correlate the results. Here we present fundamental atomic-scale studies of several model grain boundaries.

Original language	English (US)
Title of host publication	2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	1-3
Number of pages	3
ISBN (Electronic)	9781509056057
DOIs	https://doi.org/10.1109/PVSC.2017.8366877
State	Published - 2017
Event	44th IEEE Photovoltaic Specialist Conference, PVSC 2017 - Washington, United States Duration: Jun 25 2017 → Jun 30 2017

Publication series

Name	2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017

Other

Other	44th IEEE Photovoltaic Specialist Conference, PVSC 2017
Country/Territory	United States
City	Washington
Period	6/25/17 → 6/30/17

ASJC Scopus subject areas

Renewable Energy, Sustainability and the Environment
Electrical and Electronic Engineering
Electronic, Optical and Magnetic Materials

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

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10.1109/PVSC.2017.8366877

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Paulauskas, T., Sen, F., Sun, C., Barnard, E., Kim, M., Sivalingham, S., Chan, M., & Klie, R. (2017). Atomic - Scale study of model CdTe grain boundaries. In 2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017 (pp. 1-3). (2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/PVSC.2017.8366877

@inproceedings{ffaeae6b15ad4bc3aebe339855c2b910,

title = "Atomic - Scale study of model CdTe grain boundaries",

abstract = "Poly-crystalline CdTe-based thin film photovoltaic (PV) devices are the forerunners in commercialized solar cell technology. Despite the commercial success, best laboratory cells achieve ∼21.5% power conversion efficiency and hence are still ∼10% short of theoretical limit. In this collaborative research project we investigate effects of the grain boundaries via wafer- bonded CdTe bicrystals. Lifetime measurements are carried out using two-photon absorption, while atomic resolution imaging and first-principles calculations are used to correlate the results. Here we present fundamental atomic-scale studies of several model grain boundaries.",

author = "Tadas Paulauskas and Fatih Sen and Cyrus Sun and Edward Barnard and Moon Kim and Sivananthan Sivalingham and Maria Chan and Robert Klie",

note = "Publisher Copyright: {\textcopyright} 2017 IEEE.; 44th IEEE Photovoltaic Specialist Conference, PVSC 2017 ; Conference date: 25-06-2017 Through 30-06-2017",

year = "2017",

doi = "10.1109/PVSC.2017.8366877",

language = "English (US)",

series = "2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "1--3",

booktitle = "2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017",

address = "United States",

}

Paulauskas, T, Sen, F, Sun, C, Barnard, E, Kim, M, Sivalingham, S, Chan, M & Klie, R 2017, Atomic - Scale study of model CdTe grain boundaries. in 2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017. 2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017, Institute of Electrical and Electronics Engineers Inc., pp. 1-3, 44th IEEE Photovoltaic Specialist Conference, PVSC 2017, Washington, United States, 6/25/17. https://doi.org/10.1109/PVSC.2017.8366877

Atomic - Scale study of model CdTe grain boundaries. / Paulauskas, Tadas; Sen, Fatih; Sun, Cyrus et al.
2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017. Institute of Electrical and Electronics Engineers Inc., 2017. p. 1-3 (2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - Atomic - Scale study of model CdTe grain boundaries

AU - Paulauskas, Tadas

AU - Sen, Fatih

AU - Sun, Cyrus

AU - Barnard, Edward

AU - Kim, Moon

AU - Sivalingham, Sivananthan

AU - Chan, Maria

AU - Klie, Robert

PY - 2017

Y1 - 2017

N2 - Poly-crystalline CdTe-based thin film photovoltaic (PV) devices are the forerunners in commercialized solar cell technology. Despite the commercial success, best laboratory cells achieve ∼21.5% power conversion efficiency and hence are still ∼10% short of theoretical limit. In this collaborative research project we investigate effects of the grain boundaries via wafer- bonded CdTe bicrystals. Lifetime measurements are carried out using two-photon absorption, while atomic resolution imaging and first-principles calculations are used to correlate the results. Here we present fundamental atomic-scale studies of several model grain boundaries.

AB - Poly-crystalline CdTe-based thin film photovoltaic (PV) devices are the forerunners in commercialized solar cell technology. Despite the commercial success, best laboratory cells achieve ∼21.5% power conversion efficiency and hence are still ∼10% short of theoretical limit. In this collaborative research project we investigate effects of the grain boundaries via wafer- bonded CdTe bicrystals. Lifetime measurements are carried out using two-photon absorption, while atomic resolution imaging and first-principles calculations are used to correlate the results. Here we present fundamental atomic-scale studies of several model grain boundaries.

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U2 - 10.1109/PVSC.2017.8366877

DO - 10.1109/PVSC.2017.8366877

M3 - Conference contribution

AN - SCOPUS:85048461909

T3 - 2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017

SP - 1

EP - 3

BT - 2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 44th IEEE Photovoltaic Specialist Conference, PVSC 2017

Y2 - 25 June 2017 through 30 June 2017

ER -

Atomic - Scale study of model CdTe grain boundaries

Abstract

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Other

ASJC Scopus subject areas

UN SDGs

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