TY - GEN
T1 - Automated electron nanocrystallography
AU - Spence, John
AU - McKeown, Joseph
AU - He, Haifeng
AU - Wu, Jinsong
PY - 2008
Y1 - 2008
N2 - Methods for solving crystalline nanostructures in real time at the electron microscope are reviewed, based on automated collection of microdiffraction patterns in three dimensions. We compare Koehler mode "SAD" patterns, a new kinematic CBED mode, and our new precession electron diffraction system. We discuss the optimum data-collection strategy and the eucentric-tilt problem. We advocate use of the new "charge-flipping" algorithm for solving the phase problem when dealing with relatively poor-quality electron diffraction data. We show an experimental demonstration of the effect of precession on the quality of diffraction data and of the use of the flipping algorithm to solve a nanocrystal.
AB - Methods for solving crystalline nanostructures in real time at the electron microscope are reviewed, based on automated collection of microdiffraction patterns in three dimensions. We compare Koehler mode "SAD" patterns, a new kinematic CBED mode, and our new precession electron diffraction system. We discuss the optimum data-collection strategy and the eucentric-tilt problem. We advocate use of the new "charge-flipping" algorithm for solving the phase problem when dealing with relatively poor-quality electron diffraction data. We show an experimental demonstration of the effect of precession on the quality of diffraction data and of the use of the flipping algorithm to solve a nanocrystal.
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M3 - Conference contribution
AN - SCOPUS:70350333918
SN - 9781605608167
T3 - Materials Research Society Symposium Proceedings
SP - 20
EP - 29
BT - Quantitative Electron Microscopy for Materials Science
T2 - 2007 MRS Fall Meeting
Y2 - 26 November 2007 through 30 November 2007
ER -