Automated electron nanocrystallography

John Spence*, Joseph McKeown, Haifeng He, Jinsong Wu

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

Methods for solving crystalline nanostructures in real time at the electron microscope are reviewed, based on automated collection of microdiffraction patterns in three dimensions. We compare Koehler mode "SAD" patterns, a new kinematic CBED mode, and our new precession electron diffraction system. We discuss the optimum data-collection strategy and the eucentric-tilt problem. We advocate use of the new "charge-flipping" algorithm for solving the phase problem when dealing with relatively poor-quality electron diffraction data. We show an experimental demonstration of the effect of precession on the quality of diffraction data and of the use of the flipping algorithm to solve a nanocrystal.

Original languageEnglish (US)
Title of host publicationQuantitative Electron Microscopy for Materials Science
Pages20-29
Number of pages10
StatePublished - Dec 1 2008
Event2007 MRS Fall Meeting - Boston, MA, United States
Duration: Nov 26 2007Nov 30 2007

Publication series

NameMaterials Research Society Symposium Proceedings
Volume1026
ISSN (Print)0272-9172

Other

Other2007 MRS Fall Meeting
CountryUnited States
CityBoston, MA
Period11/26/0711/30/07

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ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

Cite this

Spence, J., McKeown, J., He, H., & Wu, J. (2008). Automated electron nanocrystallography. In Quantitative Electron Microscopy for Materials Science (pp. 20-29). (Materials Research Society Symposium Proceedings; Vol. 1026).