Automated line flattening of atomic force microscopy images

S. A. Tsaftaris; J. Zujovic; Aggelos K Katsaggelos

doi:10.1109/ICIP.2008.4712418

Automated line flattening of atomic force microscopy images

S. A. Tsaftaris, J. Zujovic, Aggelos K Katsaggelos

Electrical and Computer Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

3 Scopus citations

Abstract

In this paper, an automated algorithm to flatten lines from Atomic Force Microscopy (AFM) images is presented. Due to the mechanics of the AFM, there is a curvature distortion (bowing effect) present in the acquired images. At present, flattening such images requires human intervention to manually segment object data from the background, which is time consuming and highly inaccurate. The proposed method classifies the data into objects and background, and fits convex lines in an iterative fashion. Results on real images from DNA wrapped carbon nanotubes (DNA-CNTs) and synthetic experiments are presented, demonstrating the effectiveness of the proposed algorithm in increasing the resolution of the surface topography.

Original language	English (US)
Title of host publication	2008 IEEE International Conference on Image Processing, ICIP 2008 Proceedings
Pages	2968-2971
Number of pages	4
DOIs	https://doi.org/10.1109/ICIP.2008.4712418
State	Published - Dec 1 2008
Event	2008 IEEE International Conference on Image Processing, ICIP 2008 - San Diego, CA, United States Duration: Oct 12 2008 → Oct 15 2008

Publication series

Name	Proceedings - International Conference on Image Processing, ICIP
ISSN (Print)	1522-4880

Other

Other	2008 IEEE International Conference on Image Processing, ICIP 2008
Country/Territory	United States
City	San Diego, CA
Period	10/12/08 → 10/15/08

Keywords

Curve fitting
Nanotechnology
Object detection
Polynomial approximation

ASJC Scopus subject areas

Software
Computer Vision and Pattern Recognition
Signal Processing

Access to Document

10.1109/ICIP.2008.4712418

Cite this

@inproceedings{307af8849e034fb3a6ea4fda16064b55,

title = "Automated line flattening of atomic force microscopy images",

abstract = "In this paper, an automated algorithm to flatten lines from Atomic Force Microscopy (AFM) images is presented. Due to the mechanics of the AFM, there is a curvature distortion (bowing effect) present in the acquired images. At present, flattening such images requires human intervention to manually segment object data from the background, which is time consuming and highly inaccurate. The proposed method classifies the data into objects and background, and fits convex lines in an iterative fashion. Results on real images from DNA wrapped carbon nanotubes (DNA-CNTs) and synthetic experiments are presented, demonstrating the effectiveness of the proposed algorithm in increasing the resolution of the surface topography.",

keywords = "Curve fitting, Nanotechnology, Object detection, Polynomial approximation",

author = "Tsaftaris, {S. A.} and J. Zujovic and Katsaggelos, {Aggelos K}",

year = "2008",

month = dec,

day = "1",

doi = "10.1109/ICIP.2008.4712418",

language = "English (US)",

isbn = "1424417643",

series = "Proceedings - International Conference on Image Processing, ICIP",

pages = "2968--2971",

booktitle = "2008 IEEE International Conference on Image Processing, ICIP 2008 Proceedings",

note = "2008 IEEE International Conference on Image Processing, ICIP 2008 ; Conference date: 12-10-2008 Through 15-10-2008",

}

Tsaftaris, SA, Zujovic, J & Katsaggelos, AK 2008, Automated line flattening of atomic force microscopy images. in 2008 IEEE International Conference on Image Processing, ICIP 2008 Proceedings., 4712418, Proceedings - International Conference on Image Processing, ICIP, pp. 2968-2971, 2008 IEEE International Conference on Image Processing, ICIP 2008, San Diego, CA, United States, 10/12/08. https://doi.org/10.1109/ICIP.2008.4712418

Automated line flattening of atomic force microscopy images. / Tsaftaris, S. A.; Zujovic, J.; Katsaggelos, Aggelos K.

2008 IEEE International Conference on Image Processing, ICIP 2008 Proceedings. 2008. p. 2968-2971 4712418 (Proceedings - International Conference on Image Processing, ICIP).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - Automated line flattening of atomic force microscopy images

AU - Tsaftaris, S. A.

AU - Zujovic, J.

AU - Katsaggelos, Aggelos K

PY - 2008/12/1

Y1 - 2008/12/1

N2 - In this paper, an automated algorithm to flatten lines from Atomic Force Microscopy (AFM) images is presented. Due to the mechanics of the AFM, there is a curvature distortion (bowing effect) present in the acquired images. At present, flattening such images requires human intervention to manually segment object data from the background, which is time consuming and highly inaccurate. The proposed method classifies the data into objects and background, and fits convex lines in an iterative fashion. Results on real images from DNA wrapped carbon nanotubes (DNA-CNTs) and synthetic experiments are presented, demonstrating the effectiveness of the proposed algorithm in increasing the resolution of the surface topography.

AB - In this paper, an automated algorithm to flatten lines from Atomic Force Microscopy (AFM) images is presented. Due to the mechanics of the AFM, there is a curvature distortion (bowing effect) present in the acquired images. At present, flattening such images requires human intervention to manually segment object data from the background, which is time consuming and highly inaccurate. The proposed method classifies the data into objects and background, and fits convex lines in an iterative fashion. Results on real images from DNA wrapped carbon nanotubes (DNA-CNTs) and synthetic experiments are presented, demonstrating the effectiveness of the proposed algorithm in increasing the resolution of the surface topography.

KW - Curve fitting

KW - Nanotechnology

KW - Object detection

KW - Polynomial approximation

UR - http://www.scopus.com/inward/record.url?scp=69949147094&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=69949147094&partnerID=8YFLogxK

U2 - 10.1109/ICIP.2008.4712418

DO - 10.1109/ICIP.2008.4712418

M3 - Conference contribution

AN - SCOPUS:69949147094

SN - 1424417643

SN - 9781424417643

T3 - Proceedings - International Conference on Image Processing, ICIP

SP - 2968

EP - 2971

BT - 2008 IEEE International Conference on Image Processing, ICIP 2008 Proceedings

T2 - 2008 IEEE International Conference on Image Processing, ICIP 2008

Y2 - 12 October 2008 through 15 October 2008

ER -

Automated line flattening of atomic force microscopy images

Abstract

Publication series

Other

Keywords

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this