TY - GEN
T1 - Automated line flattening of atomic force microscopy images
AU - Tsaftaris, S. A.
AU - Zujovic, J.
AU - Katsaggelos, Aggelos K
PY - 2008/12/1
Y1 - 2008/12/1
N2 - In this paper, an automated algorithm to flatten lines from Atomic Force Microscopy (AFM) images is presented. Due to the mechanics of the AFM, there is a curvature distortion (bowing effect) present in the acquired images. At present, flattening such images requires human intervention to manually segment object data from the background, which is time consuming and highly inaccurate. The proposed method classifies the data into objects and background, and fits convex lines in an iterative fashion. Results on real images from DNA wrapped carbon nanotubes (DNA-CNTs) and synthetic experiments are presented, demonstrating the effectiveness of the proposed algorithm in increasing the resolution of the surface topography.
AB - In this paper, an automated algorithm to flatten lines from Atomic Force Microscopy (AFM) images is presented. Due to the mechanics of the AFM, there is a curvature distortion (bowing effect) present in the acquired images. At present, flattening such images requires human intervention to manually segment object data from the background, which is time consuming and highly inaccurate. The proposed method classifies the data into objects and background, and fits convex lines in an iterative fashion. Results on real images from DNA wrapped carbon nanotubes (DNA-CNTs) and synthetic experiments are presented, demonstrating the effectiveness of the proposed algorithm in increasing the resolution of the surface topography.
KW - Curve fitting
KW - Nanotechnology
KW - Object detection
KW - Polynomial approximation
UR - http://www.scopus.com/inward/record.url?scp=69949147094&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=69949147094&partnerID=8YFLogxK
U2 - 10.1109/ICIP.2008.4712418
DO - 10.1109/ICIP.2008.4712418
M3 - Conference contribution
AN - SCOPUS:69949147094
SN - 1424417643
SN - 9781424417643
T3 - Proceedings - International Conference on Image Processing, ICIP
SP - 2968
EP - 2971
BT - 2008 IEEE International Conference on Image Processing, ICIP 2008 Proceedings
T2 - 2008 IEEE International Conference on Image Processing, ICIP 2008
Y2 - 12 October 2008 through 15 October 2008
ER -