Automatic temperature-controlled helium-vapor cryostat for atom-probe field-ion microscopy studies

G. P.E.M. Van Bakel*, D. A. Shashkov, David N Seidman

*Corresponding author for this work

Research output: Contribution to journalArticle

5 Citations (Scopus)

Abstract

An automatic temperature control mechanism was fabricated from readily available components and installed on an existing continuous flow helium-vapor cryostat as part of an atom-probe field-ion microscope. This control system eliminates tedious manual adjustment of the vapor flow rate. It is shown that the time needed to cool the cryostat from room temperature to a cryogenic temperature is reduced from 3 to 1 h. Within the 40-80 K range changes in the setpoint temperature are accommodated within 10 min. The temperature stability is better than 0.1 K.

Original languageEnglish (US)
Pages (from-to)3774-3776
Number of pages3
JournalReview of Scientific Instruments
Volume66
Issue number7
DOIs
StatePublished - Dec 1 1995

Fingerprint

Cryostats
cryostats
Helium
Microscopic examination
helium
Vapors
vapors
microscopy
ion microscopes
Atoms
probes
temperature control
Ions
cryogenic temperature
atoms
ions
flow velocity
adjusting
Ion microscopes
Temperature

ASJC Scopus subject areas

  • Instrumentation

Cite this

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abstract = "An automatic temperature control mechanism was fabricated from readily available components and installed on an existing continuous flow helium-vapor cryostat as part of an atom-probe field-ion microscope. This control system eliminates tedious manual adjustment of the vapor flow rate. It is shown that the time needed to cool the cryostat from room temperature to a cryogenic temperature is reduced from 3 to 1 h. Within the 40-80 K range changes in the setpoint temperature are accommodated within 10 min. The temperature stability is better than 0.1 K.",
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Automatic temperature-controlled helium-vapor cryostat for atom-probe field-ion microscopy studies. / Van Bakel, G. P.E.M.; Shashkov, D. A.; Seidman, David N.

In: Review of Scientific Instruments, Vol. 66, No. 7, 01.12.1995, p. 3774-3776.

Research output: Contribution to journalArticle

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