Automatic temperature-controlled helium-vapor cryostat for atom-probe field-ion microscopy studies

G. P.E.M. Van Bakel*, D. A. Shashkov, David N Seidman

*Corresponding author for this work

Research output: Contribution to journalArticle

5 Scopus citations

Abstract

An automatic temperature control mechanism was fabricated from readily available components and installed on an existing continuous flow helium-vapor cryostat as part of an atom-probe field-ion microscope. This control system eliminates tedious manual adjustment of the vapor flow rate. It is shown that the time needed to cool the cryostat from room temperature to a cryogenic temperature is reduced from 3 to 1 h. Within the 40-80 K range changes in the setpoint temperature are accommodated within 10 min. The temperature stability is better than 0.1 K.

Original languageEnglish (US)
Pages (from-to)3774-3776
Number of pages3
JournalReview of Scientific Instruments
Volume66
Issue number7
DOIs
StatePublished - Dec 1 1995

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ASJC Scopus subject areas

  • Instrumentation

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