Autowave principles for parallel image processing

V. I. Krinsky*, V. N. Biktashev, I. R. Efimov

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

83 Scopus citations


A highly parallel autowave method for pattern analysis and topological feature detection is presented. It is invariant against translations, rotations and scaling of the input pattern. The method yields an increase in computational speed of 3 to 6 orders of magnitude in comparison with a sequential (von Neumann) computer. The method can be realized in principle using only one chip with simple uniform connections of elements.

Original languageEnglish (US)
Pages (from-to)247-253
Number of pages7
JournalPhysica D: Nonlinear Phenomena
Issue number1-2
StatePublished - Apr 1 1991
Externally publishedYes

ASJC Scopus subject areas

  • Statistical and Nonlinear Physics
  • Mathematical Physics
  • Condensed Matter Physics
  • Applied Mathematics


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