Background intensity problems in high resolution defect imaging

A. Howie; N. Jiang; J. C H Spence; J. Wu

doi:10.1017/S1431927606062246

Background intensity problems in high resolution defect imaging

A. Howie^*, N. Jiang, J. C H Spence, J. Wu

^*Corresponding author for this work

Materials Science and Engineering

Research output: Contribution to journal › Article › peer-review

Original language	English (US)
Pages (from-to)	900-901
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	12
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/S1431927606062246
State	Published - Aug 2006

ASJC Scopus subject areas

Instrumentation

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title = "Background intensity problems in high resolution defect imaging",

author = "A. Howie and N. Jiang and Spence, {J. C H} and J. Wu",

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AU - Spence, J. C H

AU - Wu, J.

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JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

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Background intensity problems in high resolution defect imaging

ASJC Scopus subject areas

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