Beam steering in narrow-stripe, high-power 980 nm laser diodes

M. Selim Unlu*, W. D. Herzog, Bennett B. Goldberg

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review


Near-field scanning optical microscopy (NSOM) was used to image the output of a 980 nm, graded-index, separate-confinement, heterostructure (GRINSCH) laser diode. Measurements were made on the output of both the antireflection (AR) and high-reflection (HR) coated facets. The NSOM images of the laser near-field were correlated with far-field measurements of beam-steering as a function of the laser diode operating current with an emphasis on the behavior at around the L-I kink.

Original languageEnglish (US)
Pages (from-to)870-871
Number of pages2
JournalConference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS
StatePublished - Dec 1 2000

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Electrical and Electronic Engineering
  • Industrial and Manufacturing Engineering

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