Abstract
Near-field scanning optical microscopy (NSOM) was used to image the output of a 980 nm, graded-index, separate-confinement, heterostructure (GRINSCH) laser diode. Measurements were made on the output of both the antireflection (AR) and high-reflection (HR) coated facets. The NSOM images of the laser near-field were correlated with far-field measurements of beam-steering as a function of the laser diode operating current with an emphasis on the behavior at around the L-I kink.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 870-871 |
| Number of pages | 2 |
| Journal | Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS |
| Volume | 2 |
| State | Published - Dec 1 2000 |
ASJC Scopus subject areas
- Control and Systems Engineering
- Electrical and Electronic Engineering
- Industrial and Manufacturing Engineering