Bicrystallography and electron diffraction

Vinayak P Dravid*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

Bicrystallography is the complete geometric description of bicrystal having an interface. It can be applied in the study of interface/surface structure, thin film growth and small particles. Two methods are used in bicrystal diffraction experiments the plan view CBED technique and the analysis involving edge on interface parallel to the electron beam. Plan view CBED is used to determine loss of symmetry caused by rigid body translation. While edge on geometry of interfaces is used in nanodiffraction experiments.

Original languageEnglish (US)
Pages (from-to)702-703
Number of pages2
JournalProceedings - Annual Meeting, Microscopy Society of America
StatePublished - Dec 1 1993

ASJC Scopus subject areas

  • Engineering(all)

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