Bi/Sb superlattices grown by molecular beam epitaxy

Sunglae Cho; Yunki Kim; Antonio DiVenere; George K. Wong; John B. Ketterson; Jung Il Hong

doi:10.1116/1.581971

Bi/Sb superlattices grown by molecular beam epitaxy

Sunglae Cho^*, Yunki Kim, Antonio DiVenere, George K. Wong, John B. Ketterson, Jung Il Hong

^*Corresponding author for this work

MRC - Materials Research Center

Research output: Contribution to journal › Article › peer-review

6 Scopus citations

Abstract

Epitaxial Bi/Sb superlattices have been grown by molecular beam epitaxy on CdTe(111)B substrates. The superlattice modulation wavelength was in the range of 20-200 Å. Structural properties have been investigated using in situ reflection high-energy electron diffraction (RHEED), θ-2θ x-ray diffraction (XRD) analysis, and high-resolution transmission electron microscopy (TEM). The streaked RHEED patterns of Bi on Sb (or Sb on Bi) with clear Kikuchi lines indicate layer-by-layer growth with good epitaxial layer quality. The narrow XRD rocking curves for the central and the satellite peaks suggest that the interfaces are very sharp and that the superlattice periods do not fluctuate, which is demonstrated in this article by cross-sectional TEM.

Original language	English (US)
Pages (from-to)	2987-2990
Number of pages	4
Journal	Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Volume	17
Issue number	5
DOIs	https://doi.org/10.1116/1.581971
State	Published - 1999

ASJC Scopus subject areas

Condensed Matter Physics
Surfaces and Interfaces
Surfaces, Coatings and Films

Access to Document

10.1116/1.581971

Cite this

@article{a53ae2aba7664c48bc0796882cabe942,

title = "Bi/Sb superlattices grown by molecular beam epitaxy",

abstract = "Epitaxial Bi/Sb superlattices have been grown by molecular beam epitaxy on CdTe(111)B substrates. The superlattice modulation wavelength was in the range of 20-200 {\AA}. Structural properties have been investigated using in situ reflection high-energy electron diffraction (RHEED), θ-2θ x-ray diffraction (XRD) analysis, and high-resolution transmission electron microscopy (TEM). The streaked RHEED patterns of Bi on Sb (or Sb on Bi) with clear Kikuchi lines indicate layer-by-layer growth with good epitaxial layer quality. The narrow XRD rocking curves for the central and the satellite peaks suggest that the interfaces are very sharp and that the superlattice periods do not fluctuate, which is demonstrated in this article by cross-sectional TEM.",

author = "Sunglae Cho and Yunki Kim and Antonio DiVenere and Wong, {George K.} and Ketterson, {John B.} and Hong, {Jung Il}",

year = "1999",

doi = "10.1116/1.581971",

language = "English (US)",

volume = "17",

pages = "2987--2990",

journal = "Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films",

issn = "0734-2101",

publisher = "AVS Science and Technology Society",

number = "5",

}

TY - JOUR

T1 - Bi/Sb superlattices grown by molecular beam epitaxy

AU - Cho, Sunglae

AU - Kim, Yunki

AU - DiVenere, Antonio

AU - Wong, George K.

AU - Ketterson, John B.

AU - Hong, Jung Il

PY - 1999

Y1 - 1999

N2 - Epitaxial Bi/Sb superlattices have been grown by molecular beam epitaxy on CdTe(111)B substrates. The superlattice modulation wavelength was in the range of 20-200 Å. Structural properties have been investigated using in situ reflection high-energy electron diffraction (RHEED), θ-2θ x-ray diffraction (XRD) analysis, and high-resolution transmission electron microscopy (TEM). The streaked RHEED patterns of Bi on Sb (or Sb on Bi) with clear Kikuchi lines indicate layer-by-layer growth with good epitaxial layer quality. The narrow XRD rocking curves for the central and the satellite peaks suggest that the interfaces are very sharp and that the superlattice periods do not fluctuate, which is demonstrated in this article by cross-sectional TEM.

AB - Epitaxial Bi/Sb superlattices have been grown by molecular beam epitaxy on CdTe(111)B substrates. The superlattice modulation wavelength was in the range of 20-200 Å. Structural properties have been investigated using in situ reflection high-energy electron diffraction (RHEED), θ-2θ x-ray diffraction (XRD) analysis, and high-resolution transmission electron microscopy (TEM). The streaked RHEED patterns of Bi on Sb (or Sb on Bi) with clear Kikuchi lines indicate layer-by-layer growth with good epitaxial layer quality. The narrow XRD rocking curves for the central and the satellite peaks suggest that the interfaces are very sharp and that the superlattice periods do not fluctuate, which is demonstrated in this article by cross-sectional TEM.

UR - http://www.scopus.com/inward/record.url?scp=0033440686&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0033440686&partnerID=8YFLogxK

U2 - 10.1116/1.581971

DO - 10.1116/1.581971

M3 - Article

AN - SCOPUS:0033440686

SN - 0734-2101

VL - 17

SP - 2987

EP - 2990

JO - Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

JF - Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

IS - 5

ER -

Bi/Sb superlattices grown by molecular beam epitaxy

Abstract

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this