Bi/Sb superlattices grown by molecular beam epitaxy

Sunglae Cho*, Yunki Kim, Antonio DiVenere, George K. Wong, John B. Ketterson, Jung Il Hong

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

6 Scopus citations


Epitaxial Bi/Sb superlattices have been grown by molecular beam epitaxy on CdTe(111)B substrates. The superlattice modulation wavelength was in the range of 20-200 Å. Structural properties have been investigated using in situ reflection high-energy electron diffraction (RHEED), θ-2θ x-ray diffraction (XRD) analysis, and high-resolution transmission electron microscopy (TEM). The streaked RHEED patterns of Bi on Sb (or Sb on Bi) with clear Kikuchi lines indicate layer-by-layer growth with good epitaxial layer quality. The narrow XRD rocking curves for the central and the satellite peaks suggest that the interfaces are very sharp and that the superlattice periods do not fluctuate, which is demonstrated in this article by cross-sectional TEM.

Original languageEnglish (US)
Pages (from-to)2987-2990
Number of pages4
JournalJournal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Issue number5
StatePublished - 1999

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films


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