Using the strong disorder renormalization group method, we study numerically the critical behavior of the random transverse Ising model at a free surface, at a corner, and at an edge in two-, three-, and four-dimensional lattices. The surface magnetization exponents are found to be x s=1.60(2), 2.65(15), and 3.7(1) in D=2, 3, and 4, respectively, which do not depend on the form of disorder. We have also studied critical magnetization profiles in slab, pyramid, and wedge geometries with fixed-free boundary conditions and analyzed their scaling behavior.
|Original language||English (US)|
|Journal||Physical Review B - Condensed Matter and Materials Physics|
|State||Published - Jan 18 2013|
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics