Buckling of a stiff thin film on a compliant substrate in large deformation

J. Song; H. Jiang; Z. J. Liu; D. Y. Khang; Y. Huang; J. A. Rogers; C. Lu; C. G. Koh

doi:10.1016/j.ijsolstr.2008.01.023

Buckling of a stiff thin film on a compliant substrate in large deformation

J. Song, H. Jiang, Z. J. Liu, D. Y. Khang, Y. Huang^*, J. A. Rogers, C. Lu, C. G. Koh

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

226 Scopus citations

Abstract

A finite-deformation theory is developed to study the mechanics of thin buckled films on compliant substrates. Perturbation analysis is performed for this highly nonlinear system to obtain the analytical solution. The results agree well with experiments and finite element analysis in wavelength and amplitude. In particular, it is found that the wavelength depends on the strain. Based on the accurate wavelength and amplitude, the membrane and peak strains in thin films, and stretchability and compressibility of the system are also obtained analytically.

Original language	English (US)
Pages (from-to)	3107-3121
Number of pages	15
Journal	International Journal of Solids and Structures
Volume	45
Issue number	10
DOIs	https://doi.org/10.1016/j.ijsolstr.2008.01.023
State	Published - May 15 2008

Keywords

Buckling
Finite deformation
Finite element analysis
Perturbation analysis
Thin film

ASJC Scopus subject areas

Modeling and Simulation
Materials Science(all)
Condensed Matter Physics
Mechanics of Materials
Mechanical Engineering
Applied Mathematics

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10.1016/j.ijsolstr.2008.01.023

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title = "Buckling of a stiff thin film on a compliant substrate in large deformation",

abstract = "A finite-deformation theory is developed to study the mechanics of thin buckled films on compliant substrates. Perturbation analysis is performed for this highly nonlinear system to obtain the analytical solution. The results agree well with experiments and finite element analysis in wavelength and amplitude. In particular, it is found that the wavelength depends on the strain. Based on the accurate wavelength and amplitude, the membrane and peak strains in thin films, and stretchability and compressibility of the system are also obtained analytically.",

keywords = "Buckling, Finite deformation, Finite element analysis, Perturbation analysis, Thin film",

author = "J. Song and H. Jiang and Liu, {Z. J.} and Khang, {D. Y.} and Y. Huang and Rogers, {J. A.} and C. Lu and Koh, {C. G.}",

note = "Funding Information: We acknowledge the support from the National Science Foundation under Grant DMI-0328162, the U.S. Department of Energy, Division of Materials Sciences under Award No. DEFG02-91ER45439, through the Frederick Seitz MRL and Center for Microanalysis of Materials at the University of Illinois at Urbana-Champaign. H.J., Y.H., and Z.J.L., acknowledge the support from NSF CMMI-0700440, NSFC, and the Institute of High Performance Computing in Singapore, respectively.",

year = "2008",

month = may,

day = "15",

doi = "10.1016/j.ijsolstr.2008.01.023",

language = "English (US)",

volume = "45",

pages = "3107--3121",

journal = "International Journal of Solids and Structures",

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TY - JOUR

T1 - Buckling of a stiff thin film on a compliant substrate in large deformation

AU - Song, J.

AU - Jiang, H.

AU - Liu, Z. J.

AU - Khang, D. Y.

AU - Huang, Y.

AU - Rogers, J. A.

AU - Lu, C.

AU - Koh, C. G.

N1 - Funding Information: We acknowledge the support from the National Science Foundation under Grant DMI-0328162, the U.S. Department of Energy, Division of Materials Sciences under Award No. DEFG02-91ER45439, through the Frederick Seitz MRL and Center for Microanalysis of Materials at the University of Illinois at Urbana-Champaign. H.J., Y.H., and Z.J.L., acknowledge the support from NSF CMMI-0700440, NSFC, and the Institute of High Performance Computing in Singapore, respectively.

PY - 2008/5/15

Y1 - 2008/5/15

N2 - A finite-deformation theory is developed to study the mechanics of thin buckled films on compliant substrates. Perturbation analysis is performed for this highly nonlinear system to obtain the analytical solution. The results agree well with experiments and finite element analysis in wavelength and amplitude. In particular, it is found that the wavelength depends on the strain. Based on the accurate wavelength and amplitude, the membrane and peak strains in thin films, and stretchability and compressibility of the system are also obtained analytically.

AB - A finite-deformation theory is developed to study the mechanics of thin buckled films on compliant substrates. Perturbation analysis is performed for this highly nonlinear system to obtain the analytical solution. The results agree well with experiments and finite element analysis in wavelength and amplitude. In particular, it is found that the wavelength depends on the strain. Based on the accurate wavelength and amplitude, the membrane and peak strains in thin films, and stretchability and compressibility of the system are also obtained analytically.

KW - Buckling

KW - Finite deformation

KW - Finite element analysis

KW - Perturbation analysis

KW - Thin film

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VL - 45

SP - 3107

EP - 3121

JO - International Journal of Solids and Structures

JF - International Journal of Solids and Structures

IS - 10

ER -

Buckling of a stiff thin film on a compliant substrate in large deformation

Abstract

Keywords

ASJC Scopus subject areas

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