Buckling of a stiff thin film on a compliant substrate in large deformation

J. Song, H. Jiang, Z. J. Liu, D. Y. Khang, Y. Huang*, J. A. Rogers, C. Lu, C. G. Koh

*Corresponding author for this work

Research output: Contribution to journalArticle

160 Citations (Scopus)

Abstract

A finite-deformation theory is developed to study the mechanics of thin buckled films on compliant substrates. Perturbation analysis is performed for this highly nonlinear system to obtain the analytical solution. The results agree well with experiments and finite element analysis in wavelength and amplitude. In particular, it is found that the wavelength depends on the strain. Based on the accurate wavelength and amplitude, the membrane and peak strains in thin films, and stretchability and compressibility of the system are also obtained analytically.

Original languageEnglish (US)
Pages (from-to)3107-3121
Number of pages15
JournalInternational Journal of Solids and Structures
Volume45
Issue number10
DOIs
StatePublished - May 15 2008

Fingerprint

Large Deformation
buckling
Buckling
Thin Films
Substrate
Wavelength
Thin films
Substrates
thin films
wavelengths
Finite Deformation
Perturbation Analysis
Deformation Theory
Compressibility
nonlinear systems
compressibility
Mechanics
Nonlinear systems
Analytical Solution
Membrane

Keywords

  • Buckling
  • Finite deformation
  • Finite element analysis
  • Perturbation analysis
  • Thin film

ASJC Scopus subject areas

  • Modeling and Simulation
  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering
  • Applied Mathematics

Cite this

Song, J. ; Jiang, H. ; Liu, Z. J. ; Khang, D. Y. ; Huang, Y. ; Rogers, J. A. ; Lu, C. ; Koh, C. G. / Buckling of a stiff thin film on a compliant substrate in large deformation. In: International Journal of Solids and Structures. 2008 ; Vol. 45, No. 10. pp. 3107-3121.
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Buckling of a stiff thin film on a compliant substrate in large deformation. / Song, J.; Jiang, H.; Liu, Z. J.; Khang, D. Y.; Huang, Y.; Rogers, J. A.; Lu, C.; Koh, C. G.

In: International Journal of Solids and Structures, Vol. 45, No. 10, 15.05.2008, p. 3107-3121.

Research output: Contribution to journalArticle

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AU - Song, J.

AU - Jiang, H.

AU - Liu, Z. J.

AU - Khang, D. Y.

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AU - Rogers, J. A.

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AU - Koh, C. G.

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AB - A finite-deformation theory is developed to study the mechanics of thin buckled films on compliant substrates. Perturbation analysis is performed for this highly nonlinear system to obtain the analytical solution. The results agree well with experiments and finite element analysis in wavelength and amplitude. In particular, it is found that the wavelength depends on the strain. Based on the accurate wavelength and amplitude, the membrane and peak strains in thin films, and stretchability and compressibility of the system are also obtained analytically.

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