Calculation of x-ray refraction from near-edge absorption data only

Chris Jacobsen*, Steve Wang, Wenbing Yun, Sean Frigo

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

4 Scopus citations


Near-edge x-ray absorption resonances provide information on molecular orbital structure; these resonances can be exploited in x-ray spectromicroscopy to give sub-50-nanometer resolution images with chemical state sensitivity. At the same time, radiation damage sets a limit to the resolution that can be obtained in absorption mode. Phase contrast imaging may provide another means of chemical state imaging with lower radiation dose. We describe here the use of experimentally measured near-edge absorption data to estimate near-edge phase resonances. This is accomplished by splicing the near-edge data into reference data and carrying out a numerical integration of the Kramers-Kronig relation.

Original languageEnglish (US)
Article number03
Pages (from-to)23-30
Number of pages8
JournalProceedings of SPIE - The International Society for Optical Engineering
StatePublished - Dec 1 2004
EventOptical Constants of Materials for UV to X-Ray Wavelengths - Denver, CO, United States
Duration: Aug 4 2004Aug 5 2004


  • Anomalous dispersion
  • Kramers-Kronig

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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