Calibrated scanning spreading resistance microscope (SSRM) on buried-heterostructure multiple-quantum-well lasers: Probing individual quantum wells and free carrier concentrations

D. Ban*, E. H. Sargent, St J. Dixon-Warren, T. Grevatt, G. Knight, G. Pakulski, A. J.Spring Thorpe, R. Streater, J. K. White

*Corresponding author for this work

Research output: Contribution to conferencePaperpeer-review

Abstract

The results of calibrated high-spatial-resolution scanning spreading resistance microscope (SSRM) on buried-heterostructure (BH) multiple-quantum well (MQW) lasers were presented. The activated doping of the p-n-p-n thyristor current blocking layers of a BH MQW laser was discussed. The utility of calibrated SSRM to delineate quantitatively the transverse cross-sectional structure of complex two-dimensional devices was demonstrated.

Original languageEnglish (US)
Pages631-632
Number of pages2
StatePublished - 2002
EventConference on Lasers and Electro-Optics (CLEO 2002) - Long Beach, CA, United States
Duration: May 19 2002May 24 2002

Other

OtherConference on Lasers and Electro-Optics (CLEO 2002)
Country/TerritoryUnited States
CityLong Beach, CA
Period5/19/025/24/02

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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