Capacitive contacts: Making four-point characterizations without ohmic contacts

N. Isik*, M. Sichler, S. Roth, M. Grayson

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

2 Scopus citations

Abstract

Four-point measurements are carried out on a Hall bar using specially designed capacitive contacts, reproducing the transport characteristics R xx measured using standard ohmic contacts. All Rxx measurements using various combinations of ohmic and capacitive contacts are in quantitative agreement, with a calibrated scaling factor arising because of the device and measurement setup capacitances. Also amplitude and phase measurements represented with the Bode plots for all combinations of ohmic and capacitive contacts are carried out and the results compare favorably with our circuit analysis.

Original languageEnglish (US)
Pages (from-to)1435-1439
Number of pages5
JournalInternational Journal of Modern Physics B
Volume21
Issue number8-9
StatePublished - Apr 10 2007

Keywords

  • Capacitive contact
  • Ohmic contact

ASJC Scopus subject areas

  • Statistical and Nonlinear Physics
  • Condensed Matter Physics

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