Carrier escape dynamics in a single quantum well waveguide modulator

R. Bambha*, D. C. Hutchings, M. J. Snelling, P. Likamwa, A. Miller, A. L. Moretti, R. W. Wickman, K. A. Stair, T. E. Bird, J. A. Cavaillès, D. A B Miller

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

6 Scopus citations


Picosecond excite-probe studies are performed on a single quantum well waveguide modulator giving a direct measure of the escape of photogenerated carriers from a quantum well. Both the effects of exciton saturation and external field screening are observed in the transient transmission change. The results are consistent with the escape of carriers by thermionic emission.

Original languageEnglish (US)
Pages (from-to)S965-S971
JournalOptical and Quantum Electronics
Issue number12
StatePublished - Dec 1 1993

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Electrical and Electronic Engineering


Dive into the research topics of 'Carrier escape dynamics in a single quantum well waveguide modulator'. Together they form a unique fingerprint.

Cite this