Carrier escape dynamics in a single quantum well waveguide modulator

R. Bambha; D. C. Hutchings; M. J. Snelling; P. Likamwa; A. Miller; A. L. Moretti; R. W. Wickman; K. A. Stair; T. E. Bird; J. A. Cavaillès; D. A B Miller

doi:10.1007/BF00430338

Carrier escape dynamics in a single quantum well waveguide modulator

R. Bambha^*, D. C. Hutchings, M. J. Snelling, P. Likamwa, A. Miller, A. L. Moretti, R. W. Wickman, K. A. Stair, T. E. Bird, J. A. Cavaillès, D. A B Miller

^*Corresponding author for this work

Materials Science and Engineering

Research output: Contribution to journal › Article › peer-review

6 Scopus citations

Abstract

Picosecond excite-probe studies are performed on a single quantum well waveguide modulator giving a direct measure of the escape of photogenerated carriers from a quantum well. Both the effects of exciton saturation and external field screening are observed in the transient transmission change. The results are consistent with the escape of carriers by thermionic emission.

Original language	English (US)
Pages (from-to)	S965-S971
Journal	Optical and Quantum Electronics
Volume	25
Issue number	12
DOIs	https://doi.org/10.1007/BF00430338
State	Published - Dec 1 1993

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Electrical and Electronic Engineering

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@article{33beddf5ff9d498d83e1fe7b556e9b2e,

title = "Carrier escape dynamics in a single quantum well waveguide modulator",

abstract = "Picosecond excite-probe studies are performed on a single quantum well waveguide modulator giving a direct measure of the escape of photogenerated carriers from a quantum well. Both the effects of exciton saturation and external field screening are observed in the transient transmission change. The results are consistent with the escape of carriers by thermionic emission.",

author = "R. Bambha and Hutchings, {D. C.} and Snelling, {M. J.} and P. Likamwa and A. Miller and Moretti, {A. L.} and Wickman, {R. W.} and Stair, {K. A.} and Bird, {T. E.} and Cavaill{\`e}s, {J. A.} and Miller, {D. A B}",

year = "1993",

month = dec,

day = "1",

doi = "10.1007/BF00430338",

language = "English (US)",

volume = "25",

pages = "S965--S971",

journal = "Optical and Quantum Electronics",

issn = "0306-8919",

publisher = "Springer New York",

number = "12",

}

TY - JOUR

T1 - Carrier escape dynamics in a single quantum well waveguide modulator

AU - Bambha, R.

AU - Hutchings, D. C.

AU - Snelling, M. J.

AU - Likamwa, P.

AU - Miller, A.

AU - Moretti, A. L.

AU - Wickman, R. W.

AU - Stair, K. A.

AU - Bird, T. E.

AU - Cavaillès, J. A.

AU - Miller, D. A B

PY - 1993/12/1

Y1 - 1993/12/1

N2 - Picosecond excite-probe studies are performed on a single quantum well waveguide modulator giving a direct measure of the escape of photogenerated carriers from a quantum well. Both the effects of exciton saturation and external field screening are observed in the transient transmission change. The results are consistent with the escape of carriers by thermionic emission.

AB - Picosecond excite-probe studies are performed on a single quantum well waveguide modulator giving a direct measure of the escape of photogenerated carriers from a quantum well. Both the effects of exciton saturation and external field screening are observed in the transient transmission change. The results are consistent with the escape of carriers by thermionic emission.

UR - http://www.scopus.com/inward/record.url?scp=0027841450&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0027841450&partnerID=8YFLogxK

U2 - 10.1007/BF00430338

DO - 10.1007/BF00430338

M3 - Article

AN - SCOPUS:0027841450

SN - 0306-8919

VL - 25

SP - S965-S971

JO - Optical and Quantum Electronics

JF - Optical and Quantum Electronics

IS - 12

ER -

Carrier escape dynamics in a single quantum well waveguide modulator

Abstract

ASJC Scopus subject areas

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