Cell library characterization at low voltage using non-linear operating point analysis of local variations

Rahul Rithe*, Sharon Chou, Jie Gu, Alice Wang, Satyendra Datla, Gordon Gammie, Dennis Buss, Anantha Chandrakasan

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Abstract

When CMOS is operated at a supply voltage of 0.5V and below, Random Dopant Fluctuations (RDFs) result in a stochastic component of logic delay that can be comparable to the nominal delay. Moreover, the Probability Density Function (PDF) of this stochastic delay can be highly non-Gaussian. The Non-Linear, Operating Point Analysis of Local Variations (NLOPALV) technique has been shown to be accurate and computationally efficient in simulating any point on the delay PDF of a logic Timing Path (TP). This paper applies the NLOPALV approach to characterizing the stochastic delay of logic cells. NLOPALV theory is presented, and NLOPALV is used to characterize a cell library designed in 28 nm CMOS. NLOPALV is accurate to within 5% compared to SPICE-based Monte Carlo analysis.

Original languageEnglish (US)
Title of host publicationProceedings - 24th International Conference on VLSI Design, VLSI Design 2011, Held Jointly with 10th International Conference on Embedded Systems
Pages112-117
Number of pages6
DOIs
StatePublished - 2011
Event24th International Conference on VLSI Design, VLSI Design 2011, Held Jointly with 10th International Conference on Embedded Systems - Chennai, India
Duration: Jan 2 2011Jan 7 2011

Publication series

NameProceedings of the IEEE International Conference on VLSI Design
ISSN (Print)1063-9667

Other

Other24th International Conference on VLSI Design, VLSI Design 2011, Held Jointly with 10th International Conference on Embedded Systems
CountryIndia
CityChennai
Period1/2/111/7/11

Keywords

  • Local variations
  • Low voltage
  • Timing analysis

ASJC Scopus subject areas

  • Hardware and Architecture
  • Electrical and Electronic Engineering

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    Rithe, R., Chou, S., Gu, J., Wang, A., Datla, S., Gammie, G., Buss, D., & Chandrakasan, A. (2011). Cell library characterization at low voltage using non-linear operating point analysis of local variations. In Proceedings - 24th International Conference on VLSI Design, VLSI Design 2011, Held Jointly with 10th International Conference on Embedded Systems (pp. 112-117). [5718787] (Proceedings of the IEEE International Conference on VLSI Design). https://doi.org/10.1109/VLSID.2011.43