Skip to main navigation
Skip to search
Skip to main content
Northwestern Scholars Home
Help & FAQ
Home
Experts
Organizations
Research Output
Grants
Core Facilities
Research Data
Search by expertise, name or affiliation
Changes in tip structure measured during STM lithography
J. Vetrone
*
,
Y. W. Chung
*
Corresponding author for this work
Materials Science and Engineering
Research output
:
Contribution to journal
›
Article
›
peer-review
2
Scopus citations
Overview
Fingerprint
Fingerprint
Dive into the research topics of 'Changes in tip structure measured during STM lithography'. Together they form a unique fingerprint.
Sort by
Weight
Alphabetically
Keyphrases
Tip Radius
100%
Cluster Size
100%
Copper Surface
100%
STM Lithography
100%
Tip Structure
100%
Novel Technique
50%
Nanometer-sized
50%
Sampling Bias
50%
Radius of Curvature
50%
Square Root
50%
In Situ Observation
50%
Slip Band
50%
Gold Tip
50%
STM Images
50%
Engineering
Lithography
100%
Scanning Tunneling Microscopy
100%
Nanometre
33%
Square Root
33%
Situ Observation
33%
Cluster Size
33%
Sample Surface
33%
Diameter Increase
33%
Slip Band
33%
Material Science
Lithography
100%
Surface (Surface Science)
100%
Scanning Tunneling Microscopy
100%
Slip Band
33%
Chemical Engineering
Lithography
100%