Characterization of a monolayer graphitic structure

X. Lin*, X. K. Wang, Vinayak P Dravid, John B Ketterson, R P H Chang

*Corresponding author for this work

Research output: Contribution to conferencePaper

Abstract

A new material of monolayer graphitic structure was characterized by electron diffraction, high resolution transmission electron microscopy and EELS. Results indicate that there is no (002) reflection in all orientations, meaning the graphite sheets are completely separated.

Original languageEnglish (US)
Pages760-761
Number of pages2
StatePublished - Dec 1 1994
EventProceedings of the 52nd Annual Meeting of the Microscopy Society of America - New Orleans, LA, USA
Duration: Jul 31 1994Aug 5 1994

Other

OtherProceedings of the 52nd Annual Meeting of the Microscopy Society of America
CityNew Orleans, LA, USA
Period7/31/948/5/94

ASJC Scopus subject areas

  • Engineering(all)

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  • Cite this

    Lin, X., Wang, X. K., Dravid, V. P., Ketterson, J. B., & Chang, R. P. H. (1994). Characterization of a monolayer graphitic structure. 760-761. Paper presented at Proceedings of the 52nd Annual Meeting of the Microscopy Society of America, New Orleans, LA, USA, .