Characterization of a monolayer graphitic structure

X. Lin; X. K. Wang; Vinayak P Dravid; John B Ketterson; R P H Chang

Characterization of a monolayer graphitic structure

X. Lin^*, X. K. Wang, Vinayak P Dravid, John B Ketterson, R P H Chang

^*Corresponding author for this work

Research output: Contribution to conference › Paper › peer-review

Abstract

A new material of monolayer graphitic structure was characterized by electron diffraction, high resolution transmission electron microscopy and EELS. Results indicate that there is no (002) reflection in all orientations, meaning the graphite sheets are completely separated.

Original language	English (US)
Pages	760-761
Number of pages	2
State	Published - Dec 1 1994
Event	Proceedings of the 52nd Annual Meeting of the Microscopy Society of America - New Orleans, LA, USA Duration: Jul 31 1994 → Aug 5 1994

Other

Other	Proceedings of the 52nd Annual Meeting of the Microscopy Society of America
City	New Orleans, LA, USA
Period	7/31/94 → 8/5/94

ASJC Scopus subject areas

Engineering(all)

Cite this

@conference{4ab65891a28847f483aa264d89e25e2d,

title = "Characterization of a monolayer graphitic structure",

abstract = "A new material of monolayer graphitic structure was characterized by electron diffraction, high resolution transmission electron microscopy and EELS. Results indicate that there is no (002) reflection in all orientations, meaning the graphite sheets are completely separated.",

author = "X. Lin and Wang, {X. K.} and Dravid, {Vinayak P} and Ketterson, {John B} and Chang, {R P H}",

year = "1994",

month = dec,

day = "1",

language = "English (US)",

pages = "760--761",

note = "Proceedings of the 52nd Annual Meeting of the Microscopy Society of America ; Conference date: 31-07-1994 Through 05-08-1994",

}

TY - CONF

T1 - Characterization of a monolayer graphitic structure

AU - Lin, X.

AU - Wang, X. K.

AU - Dravid, Vinayak P

AU - Ketterson, John B

AU - Chang, R P H

PY - 1994/12/1

Y1 - 1994/12/1

N2 - A new material of monolayer graphitic structure was characterized by electron diffraction, high resolution transmission electron microscopy and EELS. Results indicate that there is no (002) reflection in all orientations, meaning the graphite sheets are completely separated.

AB - A new material of monolayer graphitic structure was characterized by electron diffraction, high resolution transmission electron microscopy and EELS. Results indicate that there is no (002) reflection in all orientations, meaning the graphite sheets are completely separated.

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UR - http://www.scopus.com/inward/citedby.url?scp=0028746402&partnerID=8YFLogxK

M3 - Paper

AN - SCOPUS:0028746402

SP - 760

EP - 761

T2 - Proceedings of the 52nd Annual Meeting of the Microscopy Society of America

Y2 - 31 July 1994 through 5 August 1994

ER -

Characterization of a monolayer graphitic structure

Abstract

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ASJC Scopus subject areas

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