Characterization of conductive anodic filament (CAF) by x-ray microtomography and by serial sectioning

S. R. Stock; L. L. Dollar; G. B. Freeman; W. J. Ready; L. J. Turbini; J. C. Elliott; P. Anderson; G. R. Davis

Characterization of conductive anodic filament (CAF) by x-ray microtomography and by serial sectioning

S. R. Stock^*, L. L. Dollar, G. B. Freeman, W. J. Ready, L. J. Turbini, J. C. Elliott, P. Anderson, G. R. Davis

^*Corresponding author for this work

Cell & Developmental Biology

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

3 Scopus citations

Abstract

X-ray microtomography is used to nondestructively section printed wiring boards in which conductive anodic filaments (CADs) had grown. Quantification of the spatial distribution of copper is compared for microtomography and for serial sections obtained in SEM with backscattered electrons. The agreement between the techniques is excellent and indicates that microtomography may be used confidently to follow the subsurface growth of CAFs.

Original language	English (US)
Title of host publication	Electronic Packaging Materials Science VII
Editors	Peter Borgesen, Klavs F. Jensen, Roger A. Pollak
Publisher	Publ by Materials Research Society
Pages	65-69
Number of pages	5
Volume	323
ISBN (Print)	1558992227
State	Published - Jan 1 1994
Event	Proceedings of the Fall 1993 MRS Meeting - Boston, MA, USA Duration: Nov 29 1993 → Dec 3 1993

Other

Other	Proceedings of the Fall 1993 MRS Meeting
City	Boston, MA, USA
Period	11/29/93 → 12/3/93

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials

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Stock, S. R., Dollar, L. L., Freeman, G. B., Ready, W. J., Turbini, L. J., Elliott, J. C., Anderson, P., & Davis, G. R. (1994). Characterization of conductive anodic filament (CAF) by x-ray microtomography and by serial sectioning. In P. Borgesen, K. F. Jensen, & R. A. Pollak (Eds.), Electronic Packaging Materials Science VII (Vol. 323, pp. 65-69). Publ by Materials Research Society.

Stock, S. R. ; Dollar, L. L. ; Freeman, G. B. ; Ready, W. J. ; Turbini, L. J. ; Elliott, J. C. ; Anderson, P. ; Davis, G. R. / Characterization of conductive anodic filament (CAF) by x-ray microtomography and by serial sectioning. Electronic Packaging Materials Science VII. editor / Peter Borgesen ; Klavs F. Jensen ; Roger A. Pollak. Vol. 323 Publ by Materials Research Society, 1994. pp. 65-69

@inproceedings{4c0629ca3a90479080f5f699b9d22f7d,

title = "Characterization of conductive anodic filament (CAF) by x-ray microtomography and by serial sectioning",

abstract = "X-ray microtomography is used to nondestructively section printed wiring boards in which conductive anodic filaments (CADs) had grown. Quantification of the spatial distribution of copper is compared for microtomography and for serial sections obtained in SEM with backscattered electrons. The agreement between the techniques is excellent and indicates that microtomography may be used confidently to follow the subsurface growth of CAFs.",

author = "Stock, {S. R.} and Dollar, {L. L.} and Freeman, {G. B.} and Ready, {W. J.} and Turbini, {L. J.} and Elliott, {J. C.} and P. Anderson and Davis, {G. R.}",

year = "1994",

month = jan,

day = "1",

language = "English (US)",

isbn = "1558992227",

volume = "323",

pages = "65--69",

editor = "Peter Borgesen and Jensen, {Klavs F.} and Pollak, {Roger A.}",

booktitle = "Electronic Packaging Materials Science VII",

publisher = "Publ by Materials Research Society",

note = "Proceedings of the Fall 1993 MRS Meeting ; Conference date: 29-11-1993 Through 03-12-1993",

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Stock, SR, Dollar, LL, Freeman, GB, Ready, WJ, Turbini, LJ, Elliott, JC, Anderson, P & Davis, GR 1994, Characterization of conductive anodic filament (CAF) by x-ray microtomography and by serial sectioning. in P Borgesen, KF Jensen & RA Pollak (eds), Electronic Packaging Materials Science VII. vol. 323, Publ by Materials Research Society, pp. 65-69, Proceedings of the Fall 1993 MRS Meeting, Boston, MA, USA, 11/29/93.

Characterization of conductive anodic filament (CAF) by x-ray microtomography and by serial sectioning. / Stock, S. R.; Dollar, L. L.; Freeman, G. B.; Ready, W. J.; Turbini, L. J.; Elliott, J. C.; Anderson, P.; Davis, G. R.

Electronic Packaging Materials Science VII. ed. / Peter Borgesen; Klavs F. Jensen; Roger A. Pollak. Vol. 323 Publ by Materials Research Society, 1994. p. 65-69.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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T1 - Characterization of conductive anodic filament (CAF) by x-ray microtomography and by serial sectioning

AU - Stock, S. R.

AU - Dollar, L. L.

AU - Freeman, G. B.

AU - Ready, W. J.

AU - Turbini, L. J.

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AU - Anderson, P.

AU - Davis, G. R.

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N2 - X-ray microtomography is used to nondestructively section printed wiring boards in which conductive anodic filaments (CADs) had grown. Quantification of the spatial distribution of copper is compared for microtomography and for serial sections obtained in SEM with backscattered electrons. The agreement between the techniques is excellent and indicates that microtomography may be used confidently to follow the subsurface growth of CAFs.

AB - X-ray microtomography is used to nondestructively section printed wiring boards in which conductive anodic filaments (CADs) had grown. Quantification of the spatial distribution of copper is compared for microtomography and for serial sections obtained in SEM with backscattered electrons. The agreement between the techniques is excellent and indicates that microtomography may be used confidently to follow the subsurface growth of CAFs.

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