Characterization of conductive anodic filament (CAF) by x-ray microtomography and by serial sectioning

S. R. Stock*, L. L. Dollar, G. B. Freeman, W. J. Ready, L. J. Turbini, J. C. Elliott, P. Anderson, G. R. Davis

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Scopus citations

Abstract

X-ray microtomography is used to nondestructively section printed wiring boards in which conductive anodic filaments (CADs) had grown. Quantification of the spatial distribution of copper is compared for microtomography and for serial sections obtained in SEM with backscattered electrons. The agreement between the techniques is excellent and indicates that microtomography may be used confidently to follow the subsurface growth of CAFs.

Original languageEnglish (US)
Title of host publicationElectronic Packaging Materials Science VII
EditorsPeter Borgesen, Klavs F. Jensen, Roger A. Pollak
PublisherPubl by Materials Research Society
Pages65-69
Number of pages5
Volume323
ISBN (Print)1558992227
StatePublished - Jan 1 1994
EventProceedings of the Fall 1993 MRS Meeting - Boston, MA, USA
Duration: Nov 29 1993Dec 3 1993

Other

OtherProceedings of the Fall 1993 MRS Meeting
CityBoston, MA, USA
Period11/29/9312/3/93

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials

Fingerprint Dive into the research topics of 'Characterization of conductive anodic filament (CAF) by x-ray microtomography and by serial sectioning'. Together they form a unique fingerprint.

Cite this