@inproceedings{4c0629ca3a90479080f5f699b9d22f7d,
title = "Characterization of conductive anodic filament (CAF) by x-ray microtomography and by serial sectioning",
abstract = "X-ray microtomography is used to nondestructively section printed wiring boards in which conductive anodic filaments (CADs) had grown. Quantification of the spatial distribution of copper is compared for microtomography and for serial sections obtained in SEM with backscattered electrons. The agreement between the techniques is excellent and indicates that microtomography may be used confidently to follow the subsurface growth of CAFs.",
author = "Stock, {S. R.} and Dollar, {L. L.} and Freeman, {G. B.} and Ready, {W. J.} and Turbini, {L. J.} and Elliott, {J. C.} and P. Anderson and Davis, {G. R.}",
year = "1994",
language = "English (US)",
isbn = "1558992227",
series = "Materials Research Society Symposium Proceedings",
publisher = "Publ by Materials Research Society",
pages = "65--69",
editor = "Peter Borgesen and Jensen, {Klavs F.} and Pollak, {Roger A.}",
booktitle = "Electronic Packaging Materials Science VII",
note = "Proceedings of the Fall 1993 MRS Meeting ; Conference date: 29-11-1993 Through 03-12-1993",
}