Characterization of graded-d spacing multilayers for hard X-ray telescopes

Adrian Ivan; Suzanne E. Romaine; Ricardo J. Bruni; John E. Everett; Paul Gorenstein

doi:10.1117/12.331276

Characterization of graded-d spacing multilayers for hard X-ray telescopes

Adrian Ivan^*, Suzanne E. Romaine, Ricardo J. Bruni, John E. Everett, Paul Gorenstein

^*Corresponding author for this work

CIERA - Center for Interdisciplinary Exploration and Research in Astrophysics

Research output: Contribution to journal › Conference article › peer-review

1 Scopus citations

Abstract

The Multilayer Facility at the Center for Astrophysics is involved in developing graded-d spacing multilayers for coating X-ray optics for hard X-ray focusing telescopes [1]. Graded d spacing W/C multilayers have been fabricated on flat substrates of silicon and characterized using specular X-ray reflectivity, AFM, and TEM. Results are presented and compared with theoretical models.

Original language	English (US)
Pages (from-to)	556-563
Number of pages	8
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	3444
DOIs	https://doi.org/10.1117/12.331276
State	Published - Jan 1 1998
Event	Proceedings of the 1998 Conference on X-Ray Optics, Instruments, and Missions - San Diego, CA, USA Duration: Jul 19 1998 → Jul 22 1998

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Computer Science Applications
Applied Mathematics
Electrical and Electronic Engineering

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10.1117/12.331276

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title = "Characterization of graded-d spacing multilayers for hard X-ray telescopes",

abstract = "The Multilayer Facility at the Center for Astrophysics is involved in developing graded-d spacing multilayers for coating X-ray optics for hard X-ray focusing telescopes [1]. Graded d spacing W/C multilayers have been fabricated on flat substrates of silicon and characterized using specular X-ray reflectivity, AFM, and TEM. Results are presented and compared with theoretical models.",

author = "Adrian Ivan and Romaine, {Suzanne E.} and Bruni, {Ricardo J.} and Everett, {John E.} and Paul Gorenstein",

year = "1998",

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T1 - Characterization of graded-d spacing multilayers for hard X-ray telescopes

AU - Ivan, Adrian

AU - Romaine, Suzanne E.

AU - Bruni, Ricardo J.

AU - Everett, John E.

AU - Gorenstein, Paul

PY - 1998/1/1

Y1 - 1998/1/1

N2 - The Multilayer Facility at the Center for Astrophysics is involved in developing graded-d spacing multilayers for coating X-ray optics for hard X-ray focusing telescopes [1]. Graded d spacing W/C multilayers have been fabricated on flat substrates of silicon and characterized using specular X-ray reflectivity, AFM, and TEM. Results are presented and compared with theoretical models.

AB - The Multilayer Facility at the Center for Astrophysics is involved in developing graded-d spacing multilayers for coating X-ray optics for hard X-ray focusing telescopes [1]. Graded d spacing W/C multilayers have been fabricated on flat substrates of silicon and characterized using specular X-ray reflectivity, AFM, and TEM. Results are presented and compared with theoretical models.

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DO - 10.1117/12.331276

M3 - Conference article

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VL - 3444

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EP - 563

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

T2 - Proceedings of the 1998 Conference on X-Ray Optics, Instruments, and Missions

Y2 - 19 July 1998 through 22 July 1998

ER -

Characterization of graded-d spacing multilayers for hard X-ray telescopes

Abstract

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