Characterization of graded-d spacing multilayers for hard X-ray telescopes

Adrian Ivan*, Suzanne E. Romaine, Ricardo J. Bruni, John E. Everett, Paul Gorenstein

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

1 Scopus citations


The Multilayer Facility at the Center for Astrophysics is involved in developing graded-d spacing multilayers for coating X-ray optics for hard X-ray focusing telescopes [1]. Graded d spacing W/C multilayers have been fabricated on flat substrates of silicon and characterized using specular X-ray reflectivity, AFM, and TEM. Results are presented and compared with theoretical models.

Original languageEnglish (US)
Pages (from-to)556-563
Number of pages8
JournalProceedings of SPIE - The International Society for Optical Engineering
StatePublished - Jan 1 1998
EventProceedings of the 1998 Conference on X-Ray Optics, Instruments, and Missions - San Diego, CA, USA
Duration: Jul 19 1998Jul 22 1998

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'Characterization of graded-d spacing multilayers for hard X-ray telescopes'. Together they form a unique fingerprint.

Cite this