Characterization of new materials in a four-sample thermoelectric measurement system

N. A. Ghelani*, S. Y. Loo, D. Y. Chung, S. Sportouch, S. De Nardi, M. G. Kanatzidis, T. P. Hogan, G. S. Nolas

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

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Engineering & Materials Science