Characterization of PbTe-based thermoelectric materials by scanning/ transmission electron microscopy (S/TEM)

J. He*, S. Girard, J. R. Sootsman, M. G. Kanatzidis, V. P. Dravid

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Original languageEnglish (US)
Pages (from-to)1400-1401
Number of pages2
JournalMicroscopy and Microanalysis
Issue numberSUPPL. 2
StatePublished - Jul 2009

ASJC Scopus subject areas

  • Instrumentation

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