Characterization of PbTe-based thermoelectric materials by scanning/ transmission electron microscopy (S/TEM)

J. He; S. Girard; J. R. Sootsman; M. G. Kanatzidis; V. P. Dravid

doi:10.1017/S1431927609093106

Characterization of PbTe-based thermoelectric materials by scanning/ transmission electron microscopy (S/TEM)

J. He^*, S. Girard, J. R. Sootsman, M. G. Kanatzidis, V. P. Dravid

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

Original language	English (US)
Pages (from-to)	1400-1401
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	15
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/S1431927609093106
State	Published - Jul 2009

Funding

[2] Quarez, E., et al.,Journal of the American Chemical Society, 2005. 127(25): p. 9177-9190. [3] Androulakis, J., et al.,Advanced Materials, 2006. 18(9): p. 1170. [4]This work is supported by the Office of Naval Research MURI program.

ASJC Scopus subject areas

Instrumentation

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title = "Characterization of PbTe-based thermoelectric materials by scanning/ transmission electron microscopy (S/TEM)",

author = "J. He and S. Girard and Sootsman, {J. R.} and Kanatzidis, {M. G.} and Dravid, {V. P.}",

note = "Funding Information: [2] Quarez, E., et al.,Journal of the American Chemical Society, 2005. 127(25): p. 9177-9190. [3] Androulakis, J., et al.,Advanced Materials, 2006. 18(9): p. 1170. [4]This work is supported by the Office of Naval Research MURI program.",

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T1 - Characterization of PbTe-based thermoelectric materials by scanning/ transmission electron microscopy (S/TEM)

AU - He, J.

AU - Girard, S.

AU - Sootsman, J. R.

AU - Kanatzidis, M. G.

AU - Dravid, V. P.

N1 - Funding Information: [2] Quarez, E., et al.,Journal of the American Chemical Society, 2005. 127(25): p. 9177-9190. [3] Androulakis, J., et al.,Advanced Materials, 2006. 18(9): p. 1170. [4]This work is supported by the Office of Naval Research MURI program.

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IS - SUPPL. 2

ER -

Characterization of PbTe-based thermoelectric materials by scanning/ transmission electron microscopy (S/TEM)

Funding

ASJC Scopus subject areas

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