Characterization of PbTe-based thermoelectric materials by scanning/ transmission electron microscopy (S/TEM)

J. He*, S. Girard, J. R. Sootsman, M. G. Kanatzidis, V. P. Dravid

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Original languageEnglish (US)
Pages (from-to)1400-1401
Number of pages2
JournalMicroscopy and Microanalysis
Volume15
Issue numberSUPPL. 2
DOIs
StatePublished - Jul 2009

Funding

[2] Quarez, E., et al.,Journal of the American Chemical Society, 2005. 127(25): p. 9177-9190. [3] Androulakis, J., et al.,Advanced Materials, 2006. 18(9): p. 1170. [4]This work is supported by the Office of Naval Research MURI program.

ASJC Scopus subject areas

  • Instrumentation

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