Characterization of point defect generation, migration and coalescence in irradiated SiC by atomistic simulation

David Farrell^*, Noam Bernstein, Wing K Liu

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English (US)
Title of host publication	Materials Innovations for Next-Generation Nuclear Energy
Pages	66-78
Number of pages	13
Volume	1043
State	Published - Dec 1 2008
Event	2007 MRS Fall Meeting - Boston, MA, United States Duration: Nov 26 2007 → Nov 30 2007

ASJC Scopus subject areas

@inproceedings{fa8233de504f4de8a9e700ec73eb210f,

title = "Characterization of point defect generation, migration and coalescence in irradiated SiC by atomistic simulation",

author = "David Farrell and Noam Bernstein and Liu, {Wing K}",

year = "2008",

month = dec,

day = "1",

language = "English (US)",

isbn = "9781605606248",

volume = "1043",

pages = "66--78",

booktitle = "Materials Innovations for Next-Generation Nuclear Energy",

note = "2007 MRS Fall Meeting ; Conference date: 26-11-2007 Through 30-11-2007",

}

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AU - Bernstein, Noam

AU - Liu, Wing K

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M3 - Conference contribution

AN - SCOPUS:78649429966

SN - 9781605606248

VL - 1043

SP - 66

EP - 78

BT - Materials Innovations for Next-Generation Nuclear Energy

T2 - 2007 MRS Fall Meeting

Y2 - 26 November 2007 through 30 November 2007

ER -