@inproceedings{fa8233de504f4de8a9e700ec73eb210f,
title = "Characterization of point defect generation, migration and coalescence in irradiated SiC by atomistic simulation",
author = "David Farrell and Noam Bernstein and Liu, {Wing Kam}",
year = "2008",
language = "English (US)",
isbn = "9781605606248",
series = "Materials Research Society Symposium Proceedings",
pages = "66--78",
booktitle = "Materials Innovations for Next-Generation Nuclear Energy",
note = "2007 MRS Fall Meeting ; Conference date: 26-11-2007 Through 30-11-2007",
}