In situ Si-TaSi2 composites are studied by synchrotron white beam topography and by double axis diffractometry. These results show that the single crystal Si matrix is of excellent quality: Rocking curve widths are between 40 and 60 s of arc, and the topographs do not exhibit asterism. Diffuse radial streaks in the Laue patterns originate from diffraction by the TaSi 2 rods in the matrix: The K-absorption edge of filters placed in the incident x-ray beam produces a sharp change in contrast in the streaks, and this is used to determine the d spacings present in the streaks and to show that considerable preferred orientation exists between the TaSi2 rods and the Si matrix.
ASJC Scopus subject areas
- Physics and Astronomy(all)