Characterization of Si-TaSi2 in situ composites by synchrotron white beam topography and by double axis diffractometry

S. R. Stock*, Y. H. Chung, P. C. Huang, Z. U. Rek, B. M. Ditchek

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

11 Scopus citations

Abstract

In situ Si-TaSi2 composites are studied by synchrotron white beam topography and by double axis diffractometry. These results show that the single crystal Si matrix is of excellent quality: Rocking curve widths are between 40 and 60 s of arc, and the topographs do not exhibit asterism. Diffuse radial streaks in the Laue patterns originate from diffraction by the TaSi 2 rods in the matrix: The K-absorption edge of filters placed in the incident x-ray beam produces a sharp change in contrast in the streaks, and this is used to determine the d spacings present in the streaks and to show that considerable preferred orientation exists between the TaSi2 rods and the Si matrix.

Original languageEnglish (US)
Pages (from-to)1737-1742
Number of pages6
JournalJournal of Applied Physics
Volume73
Issue number4
DOIs
StatePublished - 1993

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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