Charge-contrast in SEM imaging with simultaneous ion bombardment

Benjamin D. Myers, James R. Wilson, Vinayak P Dravid, Scott A Barnett

Research output: Contribution to journalArticle

Original languageEnglish (US)
Pages (from-to)1012-1013
Number of pages2
JournalMicroscopy and Microanalysis
Volume14
Issue numberSUPPL. 2
DOIs
StatePublished - Aug 1 2008

ASJC Scopus subject areas

  • Instrumentation

Cite this