Charge-contrast in SEM imaging with simultaneous ion bombardment

Benjamin D. Myers; James R. Wilson; Vinayak P. Dravid; Scott A. Barnett

doi:10.1017/S143192760808570X

Charge-contrast in SEM imaging with simultaneous ion bombardment

Benjamin D. Myers, James R. Wilson, Vinayak P. Dravid, Scott A. Barnett

Materials Science and Engineering

Research output: Contribution to journal › Article › peer-review

Original language	English (US)
Pages (from-to)	1012-1013
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	14
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/S143192760808570X
State	Published - Aug 2008

ASJC Scopus subject areas

Instrumentation

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title = "Charge-contrast in SEM imaging with simultaneous ion bombardment",

author = "Myers, {Benjamin D.} and Wilson, {James R.} and Dravid, {Vinayak P.} and Barnett, {Scott A.}",

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journal = "Microscopy and Microanalysis",

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publisher = "Cambridge University Press",

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AU - Myers, Benjamin D.

AU - Wilson, James R.

AU - Dravid, Vinayak P.

AU - Barnett, Scott A.

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SP - 1012

EP - 1013

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

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Charge-contrast in SEM imaging with simultaneous ion bombardment

ASJC Scopus subject areas

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