Chemistry and structure of CdO/Ag{222} heterophase interfaces

D. K. Chan*, David N Seidman, K. L. Merkle

*Corresponding author for this work

Research output: Contribution to journalArticle

35 Citations (Scopus)

Abstract

The atomic scale structure and chemistry of the terminating polar plane of CdO, at atomically clean CdO/Ag{222} interfaces, produced by internal oxidation of a Ag(Cd) alloy, is studied via high-resolution electron (HREM) and atom-probe microscopies. It is demonstrated that this {222} plane can be either O or Cd with equal probability. The HREM and atom-probe results provide evidence for atomic-height steps at the CdO/Ag{222} interface. The results are explained in terms of precipitate coarsening during the internal oxidation process used to prepare the interfaces.

Original languageEnglish (US)
Pages (from-to)1118-1121
Number of pages4
JournalPhysical Review Letters
Volume75
Issue number6
DOIs
StatePublished - Jan 1 1995

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chemistry
oxidation
probes
stopping
atoms
precipitates
microscopy
high resolution
electrons

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Chan, D. K. ; Seidman, David N ; Merkle, K. L. / Chemistry and structure of CdO/Ag{222} heterophase interfaces. In: Physical Review Letters. 1995 ; Vol. 75, No. 6. pp. 1118-1121.
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Chemistry and structure of CdO/Ag{222} heterophase interfaces. / Chan, D. K.; Seidman, David N; Merkle, K. L.

In: Physical Review Letters, Vol. 75, No. 6, 01.01.1995, p. 1118-1121.

Research output: Contribution to journalArticle

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