@inproceedings{d85b74dccd214428abdf5467956820bc,
title = "Chip-scale atomic devices: Precision atomic instruments based on mems",
abstract = "We describe recent work at NIST to develop compact, low-power instruments based on a combination of precision atomic spectroscopy, advanced diode lasers and microelectromechanical systems (MEMS). Designed to be fabricated in parallel in large numbers, these {"}chip-scale{"} atomic devices may eventually impact a wide range of applications, from the global positioning system to magnetic resonance imaging and inertial navigation. We focus here on recent work to develop compact, high-performance magnetometers.",
author = "J. Kitching and S. Knappe and V. Gerginov and V. Shah and Schwindt, {P. D.D.} and B. Lindseth and Donley, {E. A.} and Wang, {Y. J.} and E. Hodby and M. Eardley and R. Jimenez and Griffith, {W. C.} and A. Geraci and J. Preusser and Liebisch, {T. C.} and Robinson, {H. G.} and L. Hollberg",
year = "2009",
doi = "10.1142/9789812838223_0056",
language = "English (US)",
isbn = "981283821X",
series = "Proceedings of the 7th Symposium on Frequency Standards and Metrology, ISFSM 2008",
publisher = "World Scientific Publishing Co. Pte Ltd",
pages = "445--453",
booktitle = "Proceedings of the 7th Symposium on Frequency Standards and Metrology, ISFSM 2008",
address = "Singapore",
note = "7th Symposium on Frequency Standards and Metrology, ISFSM 2008 ; Conference date: 05-10-2008 Through 11-10-2008",
}