@inproceedings{d85b74dccd214428abdf5467956820bc,

title = "Chip-scale atomic devices: Precision atomic instruments based on mems",

abstract = "We describe recent work at NIST to develop compact, low-power instruments based on a combination of precision atomic spectroscopy, advanced diode lasers and microelectromechanical systems (MEMS). Designed to be fabricated in parallel in large numbers, these {"}chip-scale{"} atomic devices may eventually impact a wide range of applications, from the global positioning system to magnetic resonance imaging and inertial navigation. We focus here on recent work to develop compact, high-performance magnetometers.",

author = "J. Kitching and S. Knappe and V. Gerginov and V. Shah and Schwindt, {P. D.D.} and B. Lindseth and Donley, {E. A.} and Wang, {Y. J.} and E. Hodby and M. Eardley and R. Jimenez and Griffith, {W. C.} and A. Geraci and J. Preusser and Liebisch, {T. C.} and Robinson, {H. G.} and L. Hollberg",

year = "2009",

month = dec,

day = "1",

language = "English (US)",

isbn = "981283821X",

series = "Proceedings of the 7th Symposium on Frequency Standards and Metrology, ISFSM 2008",

pages = "445--453",

booktitle = "Proceedings of the 7th Symposium on Frequency Standards and Metrology, ISFSM 2008",

note = "7th Symposium on Frequency Standards and Metrology, ISFSM 2008 ; Conference date: 05-10-2008 Through 11-10-2008",

}