Chip-scale atomic devices: Precision atomic instruments based on mems

J. Kitching, S. Knappe, V. Gerginov, V. Shah, P. D.D. Schwindt, B. Lindseth, E. A. Donley, Y. J. Wang, E. Hodby, M. Eardley, R. Jimenez, W. C. Griffith, A. Geraci, J. Preusser, T. C. Liebisch, H. G. Robinson, L. Hollberg

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Scopus citations

Abstract

We describe recent work at NIST to develop compact, low-power instruments based on a combination of precision atomic spectroscopy, advanced diode lasers and microelectromechanical systems (MEMS). Designed to be fabricated in parallel in large numbers, these "chip-scale" atomic devices may eventually impact a wide range of applications, from the global positioning system to magnetic resonance imaging and inertial navigation. We focus here on recent work to develop compact, high-performance magnetometers.

Original languageEnglish (US)
Title of host publicationProceedings of the 7th Symposium on Frequency Standards and Metrology, ISFSM 2008
Pages445-453
Number of pages9
StatePublished - Dec 1 2009
Event7th Symposium on Frequency Standards and Metrology, ISFSM 2008 - Pacific Grove, CA, United States
Duration: Oct 5 2008Oct 11 2008

Publication series

NameProceedings of the 7th Symposium on Frequency Standards and Metrology, ISFSM 2008

Other

Other7th Symposium on Frequency Standards and Metrology, ISFSM 2008
CountryUnited States
CityPacific Grove, CA
Period10/5/0810/11/08

ASJC Scopus subject areas

  • Computer Science (miscellaneous)

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