Cluster analysis of soft X-ray spectromicroscopy data

C. Jacobsen; M. Feser; M. Lerotic; S. Vogt; J. Maser; T. Schäfer

doi:10.1051/jp4:20030157

Cluster analysis of soft X-ray spectromicroscopy data

C. Jacobsen^*, M. Feser, M. Lerotic, S. Vogt, J. Maser, T. Schäfer

^*Corresponding author for this work

Physics and Astronomy

Research output: Contribution to journal › Conference article

13 Scopus citations

Abstract

We describe the use of principle component analysis (PCA) to serve as a prefilter for cluster analysis or pattern recognition analysis of soft x-ray spectromicroscopy data. Cluster analysis provides a method to group regions with common spectral features even if no prior knowledge of their spectra is available, such as in biology or environmental science.

Original language	English (US)
Pages (from-to)	623-626
Number of pages	4
Journal	Journal De Physique. IV : JP
Volume	104
DOIs	https://doi.org/10.1051/jp4:20030157
State	Published - Mar 2003
Event	7th International Conference on X-Ray Microscopy - Grenoble, France Duration: Jul 28 2002 → Aug 2 2002

ASJC Scopus subject areas

Physics and Astronomy(all)

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Jacobsen, C., Feser, M., Lerotic, M., Vogt, S., Maser, J., & Schäfer, T. (2003). Cluster analysis of soft X-ray spectromicroscopy data. Journal De Physique. IV : JP, 104, 623-626. https://doi.org/10.1051/jp4:20030157

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abstract = "We describe the use of principle component analysis (PCA) to serve as a prefilter for cluster analysis or pattern recognition analysis of soft x-ray spectromicroscopy data. Cluster analysis provides a method to group regions with common spectral features even if no prior knowledge of their spectra is available, such as in biology or environmental science.",

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AU - Feser, M.

AU - Lerotic, M.

AU - Vogt, S.

AU - Maser, J.

AU - Schäfer, T.

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