Cluster analysis of soft X-ray spectromicroscopy data

C. Jacobsen*, M. Feser, M. Lerotic, S. Vogt, J. Maser, T. Schäfer

*Corresponding author for this work

Research output: Contribution to journalConference article

13 Scopus citations

Abstract

We describe the use of principle component analysis (PCA) to serve as a prefilter for cluster analysis or pattern recognition analysis of soft x-ray spectromicroscopy data. Cluster analysis provides a method to group regions with common spectral features even if no prior knowledge of their spectra is available, such as in biology or environmental science.

Original languageEnglish (US)
Pages (from-to)623-626
Number of pages4
JournalJournal De Physique. IV : JP
Volume104
DOIs
StatePublished - Mar 2003
Event7th International Conference on X-Ray Microscopy - Grenoble, France
Duration: Jul 28 2002Aug 2 2002

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Fingerprint Dive into the research topics of 'Cluster analysis of soft X-ray spectromicroscopy data'. Together they form a unique fingerprint.

  • Cite this

    Jacobsen, C., Feser, M., Lerotic, M., Vogt, S., Maser, J., & Schäfer, T. (2003). Cluster analysis of soft X-ray spectromicroscopy data. Journal De Physique. IV : JP, 104, 623-626. https://doi.org/10.1051/jp4:20030157