Abstract
High resolution electron microscopy has been used in conjunction with electron energy loss spectroscopy to follow the beam-induced reduction of WO//3, V//2O//5 and CuO, all of which are maximal valence oxides. All three oxides underwent reduction, although there are differences in the reduction pathway: WO//3 is reduced directly to the metal by loss of oxygen from the surface layers; CuO is reduced to the metal via at least two intermdiate oxides (Cu//4O//3 and Cu//2O); and V//2O//5 forms a reduced oxide (possibly V//6O//1//3) and then remains stable. It was possible to drill holes in V//2O//5 with an intense, small electron probe (using a field-emission electron gun) provided the sample had previously only been exposed to an electron dose below a critical value ( less than 10**8 e/nm**2). Preliminary doses higher than this critical value rendered the oxide immune to hole drilling (but not to a subsequent reduction to the stable oxide mentioned above), suggesting that holes can only be drilled while the material retains the original V//2O//5 structure.
Original language | English (US) |
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Title of host publication | Materials Research Society Symposia Proceedings |
Editors | Michael O. Thompson, S.Thomas Picraux, James S. Williams |
Publisher | Materials Research Soc |
Pages | 299-304 |
Number of pages | 6 |
Volume | 74 |
ISBN (Print) | 0931837405 |
State | Published - Dec 1 1987 |
Event | Beam-Solid Interact and Transient Processes - Boston, MA, USA Duration: Dec 1 1986 → Dec 4 1986 |
Other
Other | Beam-Solid Interact and Transient Processes |
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City | Boston, MA, USA |
Period | 12/1/86 → 12/4/86 |
ASJC Scopus subject areas
- Materials Science(all)
- Condensed Matter Physics
- Mechanics of Materials
- Mechanical Engineering