Comparison of numerical aperture increasing lens and standard subsurface microscopy

S. B. Ippolito; B. B. Goldberg; M. S. Ünlü

Comparison of numerical aperture increasing lens and standard subsurface microscopy

S. B. Ippolito^*, B. B. Goldberg, M. S. Ünlü

^*Corresponding author for this work

Physics and Astronomy

Research output: Contribution to journal › Conference article › peer-review

2 Scopus citations

Abstract

Comparison of numerical aperture increasing lens (NAIL) and standard subsurface microscopy was presented. The experimentally measured modulation transfer function (MTF) was also compared with the MTF function; the optical system would exhibit. It was observed that the NAIL improves the microscope's lateral spatial resolution from ∼1.7 μm to ∼0.3 μm.

Original language	English (US)
Pages (from-to)	774-775
Number of pages	2
Journal	Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS
Volume	2
State	Published - 2001
Event	14th Annual Meeting of the IEEE Lasers and Electro-Optics Society - San Diego, CA, United States Duration: Nov 11 2001 → Nov 15 2001

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Electrical and Electronic Engineering

Cite this

@article{da7905cfee0d4bc79040401fa6aceb04,

title = "Comparison of numerical aperture increasing lens and standard subsurface microscopy",

abstract = "Comparison of numerical aperture increasing lens (NAIL) and standard subsurface microscopy was presented. The experimentally measured modulation transfer function (MTF) was also compared with the MTF function; the optical system would exhibit. It was observed that the NAIL improves the microscope's lateral spatial resolution from ∼1.7 μm to ∼0.3 μm.",

author = "Ippolito, {S. B.} and Goldberg, {B. B.} and {\"U}nl{\"u}, {M. S.}",

year = "2001",

language = "English (US)",

volume = "2",

pages = "774--775",

journal = "Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS",

issn = "1092-8081",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

note = "14th Annual Meeting of the IEEE Lasers and Electro-Optics Society ; Conference date: 11-11-2001 Through 15-11-2001",

}

TY - JOUR

T1 - Comparison of numerical aperture increasing lens and standard subsurface microscopy

AU - Ippolito, S. B.

AU - Goldberg, B. B.

AU - Ünlü, M. S.

PY - 2001

Y1 - 2001

N2 - Comparison of numerical aperture increasing lens (NAIL) and standard subsurface microscopy was presented. The experimentally measured modulation transfer function (MTF) was also compared with the MTF function; the optical system would exhibit. It was observed that the NAIL improves the microscope's lateral spatial resolution from ∼1.7 μm to ∼0.3 μm.

AB - Comparison of numerical aperture increasing lens (NAIL) and standard subsurface microscopy was presented. The experimentally measured modulation transfer function (MTF) was also compared with the MTF function; the optical system would exhibit. It was observed that the NAIL improves the microscope's lateral spatial resolution from ∼1.7 μm to ∼0.3 μm.

UR - http://www.scopus.com/inward/record.url?scp=0035653411&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0035653411&partnerID=8YFLogxK

M3 - Conference article

AN - SCOPUS:0035653411

SN - 1092-8081

VL - 2

SP - 774

EP - 775

JO - Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS

JF - Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS

T2 - 14th Annual Meeting of the IEEE Lasers and Electro-Optics Society

Y2 - 11 November 2001 through 15 November 2001

ER -

Comparison of numerical aperture increasing lens and standard subsurface microscopy

Abstract

ASJC Scopus subject areas

Other files and links

Fingerprint

Cite this