Comparison of numerical aperture increasing lens and standard subsurface microscopy

S. B. Ippolito*, B. B. Goldberg, M. S. Ünlü

*Corresponding author for this work

Research output: Contribution to journalConference article

2 Scopus citations

Abstract

Comparison of numerical aperture increasing lens (NAIL) and standard subsurface microscopy was presented. The experimentally measured modulation transfer function (MTF) was also compared with the MTF function; the optical system would exhibit. It was observed that the NAIL improves the microscope's lateral spatial resolution from ∼1.7 μm to ∼0.3 μm.

Original languageEnglish (US)
Pages (from-to)774-775
Number of pages2
JournalConference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS
Volume2
StatePublished - Dec 1 2001
Event14th Annual Meeting of the IEEE Lasers and Electro-Optics Society - San Diego, CA, United States
Duration: Nov 11 2001Nov 15 2001

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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